제조 및 생산 테스트
상세분류 제거1-25 / 116
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PC 마더보드 테스트를 위한 다중 바이어스 전압 시퀸싱 및 램핑 단순화
어플리케이션 노트 2004-10-22 |
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몇 배 증가한 DC 입력 배터리 어댑터 테스트 처리능력
어플리케이션 노트 2004-10-22 |
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애질런트 34401A를 신형 34410A/34411A 고성능 디지털 멀티미터로 교체
본 어플리케이션 노트는 애질런트 34401A 6.5 디지털 멀티미터와 신형 34410A 및 34411A 6.5디지트 고성능 DMM의 차이에 대한 높은 수준의 개요를 제공합니다.
어플리케이션 노트 2005-11-15 |
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애질런트 N67xxA 모듈식 전원 시스템을 사용하여 애질런트 662xA를 대체하는 방법
662xA - N67xxA MPS 변환 안내
어플리케이션 노트 2004-02-10 |
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자동차 ECU 테스트 처리능력 향상
어플리케이션 노트 2004-10-22 |
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10 Hints for Using Your Power Supply to Decrease Test Time
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...
어플리케이션 노트 1999-10-12 |
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3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why.
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.
어플리케이션 노트 2001-08-15 |
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223 KB
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3070 In System Programming (ISP) Family
On Board Programming, Bottom Line Benefits
어플리케이션 노트 2002-07-25 |
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200 KB
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3070 Increasing Throughput
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.
어플리케이션 노트 1997-03-03 |
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41 KB
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3070 Series 3 Flash70 Programming Guide
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.
어플리케이션 노트 2001-09-12 |
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1.85 MB
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3D Inline Solder Paste Inspection - Benefit Realized
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.
어플리케이션 노트 2003-06-01 |
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59 KB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
어플리케이션 노트 2004-08-26 |
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A New Process for Measuring and Displaying Board Test Coverage
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.
어플리케이션 노트 2003-01-01 |
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116 KB
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A Quality Test Demands A Quality Fixture
A Check List for getting a quality board test fixture first time, every time.
어플리케이션 노트 2001-05-16 |
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26 KB
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Agilent 3070 Now Powered by Industrial PC Controllers
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.
어플리케이션 노트 2003-01-23 |
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207 KB
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Agilent 3070 Outsource Series Pay-Per-Use Board Test System
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.
어플리케이션 노트 2002-03-08 |
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247 KB
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Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
어플리케이션 노트 2000-01-01 |
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AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
어플리케이션 노트 2006-04-16 |
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291 KB
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Appliance Testing
In this Application Note following the description of the appliance testing application, measurement and control requirements for characterizing devices are discussed. Then, Agilent VXI-based data acquisition suitable for such an application is listed. Description Household and commercial...
어플리케이션 노트 1997-11-01 |
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110 KB
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
어플리케이션 노트 2005-06-21 |
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Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".
어플리케이션 노트 1998-04-24 |
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14 KB
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Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.
어플리케이션 노트 2003-03-01 |
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242 KB
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Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.
어플리케이션 노트 1998-05-27 |
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29 KB
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Breakthrough Innovations: Agilent Automated Silicon Nails
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.
어플리케이션 노트 2001-08-15 |
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460 KB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
어플리케이션 노트 2008-10-15 |
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