製造與生產測試
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可進行有效預測的測試範圍工具網路影片 – 讓您快速確認潛在的測試範圍與策略
原始播放時間為 2010 年 10 月 20 日
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提高模組化量測儀器效能之網路影片
提高模組化量測儀器效能之網路影片
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3070 Family Test Development Process
Learn to develop a board test program with the Agilent 3070 Family board test system.
教室教育訓練 |
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3070 Family WIN System Administration
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.
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5DX Image Interpretation Training
Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology.
教室教育訓練 |
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5DX Operator Training
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.
教室教育訓練 |
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Accelerating DDR4 Debug and Protocol Validation Webcast
Original webcast February 26, 2013
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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012
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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011
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Basics of RF Amplifier Test With the Vector Network Analyzer
Original broadcast Mar 13, 2012
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Boundary Scan Test Methods for DDR Memories
Originally broadcast May 18, 2010
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Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012
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Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012
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Effective Crosstalk Characterization Webcast
Original broadcast January 24, 2013
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i5000 Sustaining Engineer
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In-circuit Test - Archived Event and Seminar Material
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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012
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Learn about the latest i3070 ICT productivity tools from us, DeMille Research, and Derby Associates
Originally broadcast Aug 24, 2010
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Manufacturing Test Software Solutions - Archived Event and Seminar Material
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Medalist 3070 - Archived Event and Seminar Material
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Medalist i5000 - Archived Event and Seminar Material
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New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011
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Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011
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Parametric Test Basic Training Part 2
Originally broadcast Jan 19, 2011
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Predictive Test Coverage Tool Webcast – How to Quickly Determine Potential Test Coverage & Strategy
Originally broadcast Oct 20, 2010
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