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1G - Analog Technologies Test

Agilent Technologies' 1G solutions and services help you with cell phone and base station design and production and network deployment, optimization and maintenance for 1G technologies including AMPS-NAMPS, AM-FM, TACS-ETACS-NTACS-JTACS, NMT 450/900, and CDPD-PAGING.

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Battery Drain Analysis Improves Mobile-Device Operating Time 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

PDF PDF 1.07 MB
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How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) 
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.

Application Note 2005-08-15

PDF PDF 90 KB
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IFT Battery Current Drain Solution  
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

PDF PDF 741 KB
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Testing and Troubleshooting Digital RF Communications Transmitter Designs (AN 1313) 
This Application Note covers the following 3 topics: 1) How digital communications transmitters work, 2) Essential transmitter tests and important test equipment characteristics, and 3) Troubleshooting techniques for common impairments.

Application Note 2002-01-08

PDF PDF 957 KB
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