1G - 類比技術
安捷倫科技的 1G 解決方案與服務，可協助您進行手機和基地台設計和生產、網路部署，以及 1G 技術的最佳化與維護，包括 AMPS-NAMPS、AM-FM、TACS-ETACS-NTACS-JTACS、NMT 450/900 和 CDPD-PAGING 等技術
| 行業類別 | ||||||
|---|---|---|---|---|---|---|
| AMPS-NAMPS | AMFM |
TACS ETACS NTACS JTACS |
NMT 450/900 | CDPD- Paging | ||
| 8960 系列 10 無線通訊測試儀器 | 取得具完整 RF 參數與功能測試涵蓋範圍的無線測試儀，適用於所有主要蜂巢式技術。Agilent 8960 是一個單機測試解決方案，適合目前及未來的無線裝置開發、製造與維修應用。 | Black Checkmark | ||||
| 信號產生器 | 類比信號產生器從經濟型 RF 到高效能微波無所不包，可提供廣泛範圍的效能以測試接收器和元件。 | Black Checkmark | Black Checkmark | Black Checkmark | Black Checkmark | Black Checkmark |
| PSG 微波信號產生器，250 kHZ 至 67 GHz | 安捷倫PSG 信號產生器以最經濟實惠的價格，提供業界最佳的效能。 | Black Checkmark | Black Checkmark | Black Checkmark | Black Checkmark | |
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Greater insight. Greater confidence. Accelerate next-generation wireless.
This brochure speaks to Agilent's Cellular from products, to experts to knowledge library and how Agilent gives you greater insight and greater confidence into Cellular.
型錄 2012-05-31 |
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1.37 MB
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Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.
新聞資料 2012-05-01 |
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Agilent R & D Solutions Brochure for Wireless Data Devices
Speed development of new wireless data devices with Agilent's cost-effective, multi-format R&D test solutions.
型錄 2010-02-17 |
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1.61 MB
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IFT Battery Current Drain Solution
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.
應用手冊 2008-09-30 |
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IFT: A Solution for Stress Testing Cellular Devices
Provides an overview of stress testing using the Interactive Functional Test (IFT) software with the 8960 (E5515C).
應用手冊 2008-09-30 |
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Testing Mobile Station Cell Transitions and Handovers (R&D only)
Discover how to use two 8960 test sets and GSM/GPRS/EGPRS or W-CDMA/HSDPA lab applications to test a mobile station's behavior while transitioning to a different cell via a handover or cell selection/reselection procedures.
應用手冊 2007-05-23 |
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Battery Drain Analysis Improves Mobile-Device Operating Time
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.
應用手冊 2007-02-01 |
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Testing Data Throughput of Wireless Devices (R&D only)
The 8960 Wireless Communications Test Set from Agilent Technologies features
a data throughput monitor to be used by designers during the R&D process.
應用手冊 2006-12-21 |
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Testing Push-to-Talk Over Cellular (R&D only)
With nearly 200 GCF conformance and interoperability PoC test cases now in existence, testing the compliance of PoC to industry standards is essential and Agilent's made it easy.
應用手冊 2006-07-27 |
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Testing Hybrid Mode UE: Agilent’s DO-cdma2000 Test Solution (R&D only)
Hybrid mode has added complexity to testing mobile devices, this application note explains these challenges and illustrates how Agilent test solution can help ensure conformance to industry standards.
應用手冊 2006-02-27 |
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Multi-mode Handset Manufacturing Challenges and Solutions
This application note explains the characteristics that make multi-mode user equipment difficult to test, and provides solutions to streamline UE testing while ensuring conformance to industry standards.
應用手冊 2005-11-16 |
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How Digitally Generated Faded Signals Reduce Cost of Test (R&D only)
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.
應用手冊 2005-08-15 |
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Phase and Amplitude versus Time (PAvT) Measurement Solution
This paper explains how measuring phase and amplitude versus time in mobile wireless appliances enables the characterization of the wireless device’s power amplifier.
應用手冊 2005-08-12 |
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RF Parametric and Functional Test for Wireless Designs (R&D only)
Highlights Agilent’s solutions for complete RF parametric and functional testing of wireless devices throughout the R&D cycle.
型錄 2005-07-11 |
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92 KB
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Agilent 8960無線通訊測試機組
適合無線通訊裝置開發、生產製造與維修用的彈性解決方案
型錄 2004-03-23 |
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584 KB
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Dynamic Power Measurements for cdma2000 on the Agilent 8960 Wireless Test Set
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.
應用手冊 2004-03-22 |
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8960 TIA/EIA-98-D Capability Listing
8960 Series 10 TIA/EIA-98-D Capability Listing for the E1962B and E6701A.
應用手冊 2004-02-20 |
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62 KB
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Short Message Service Testing Using the E6702B cdma2000 Test Set (R&D only)
With the release of E6702B firmware, revision B.00.04 and above, the 8960 Series test set has the ability to simulate a short message service (SMS) system.
應用手冊 2003-10-24 |
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1.41 MB
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Testing and Troubleshooting Digital RF Communications Transmitter Designs (AN 1313)
This Application Note covers the following 3 topics: 1) How digital communications transmitters work, 2) Essential transmitter tests and important test equipment characteristics, and 3) Troubleshooting techniques for common impairments.
應用手冊 2002-01-08 |
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Manufacturing Test Considerations for cdma2000 Mobiles
Agilent Manufacturing Test Considerations for cdma2000 Mobiles, A comparison of cdma2000 and cdmaOne test.
應用手冊 2001-10-03 |
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Comparison of Agilent Technologies IS-95/IS-2000 Test Sets
The existing products cover the IS-95 CDMA standard with a wealth of features,while the E5515C/E1962B provides IS-2000 coverage with a more limited feature set combined with numerous performance enhancements.
應用手冊 2001-07-18 |
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Standards Comparison for Key Measurements on Mobile Stations for cdma2000 and IS-98-C
This product note outlines the key differences between the standards for IS-95 (IS-98C) mobile stations and IS-98-D (cdma2000) mobile stations.
應用手冊 2001-03-02 |
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Multi-Coded Waveform Quality and Code Domain Measurements for cdma2000
Waveform quality is the basic measure of the performance of a CDMA system transmitter. The success of a CDMA system lies in its efficient use of power, and the waveform quality measurement gives the percent of power that correlates to the ideal code.
應用手冊 2001-02-14 |
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IS-2000 Test Mode Requirements
The test set contains an IS-2000 Base Station
Emulator (BSE). The primary purpose of the BSE is to provide the signals necessary for parametric measurements of the RF performance of an IS-2000 mobile station (MS).
應用手冊 2000-12-19 |
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728 KB
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Measuring Third-Order Intermodulation, N dB Bandwidth, and Percent AM with Built-In Functions (PN...
This Product Note explains how to use three of the advanced functions found in all 8590 C/E/L-series Spectrum Analyzers. The three functions are:
Contents
Third-Order Intermodulation
N dB Bandwidth
Percent AM
應用手冊 2000-07-01 |
PDF
86 KB
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