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1xEV-DO Test

High Rate Packet Data System is the official name of the packet data system associated with cdma2000®. However, at the 3GPP2 standards committee, the name used to describe the system was 1x Evolution Data Only, or 1xEV-DO, a name that has been attached to this system throughout the industry.

1xEV-DO requires a network operator to dedicate a single CDMA channel (1.25 MHz) exclusively to packet data traffic. The system uses the same chip rate and emission filters as are used in cdma2000 and IS-95 CDMA systems, so it is spectrally identical to the legacy systems.

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E1966A 1xEV-DO Terminal Test Application - Technical Overview 
This technical overview provides the specifications for the E1966A 1xEV-DO test application to verify and ensure the quality of RF performance of these devices.

Présentation technique 2013-04-26

PDF PDF 1.31 MB
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1xEV-DO Applications Feature Comparison 
This table compares key features present in the 8960 1xEV-DO Test and Lab Application products.

Guide de sélection 2013-04-18

PDF PDF 351 KB
Accelerate the Development of Wireless Device Tests with Automated Test Development and Support  
This brochure explains how the Agilent Wireless Test Manager products make it easy it to automate test development, expedite time-to-market for wireless devices, and reduce test costs.

Brochure 2012-08-13

PDF PDF 912 KB
EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Notes d’application 2012-08-01

PDF PDF 290 KB
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

Dossier de presse 2012-08-01

 
E6567E cdma2000/1xEV-DO/LTE Wireless Test Manager - Product Overview 
E6567E wireless test manager supports fast switching between cdma2000, 1xEV-DO, and LTE saving time in test plan development and testing.

Présentation technique 2012-06-01

PDF PDF 504 KB
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Greater insight. Greater confidence. Accelerate next-generation wireless. 
This brochure speaks to Agilent's Cellular from products, to experts to knowledge library and how Agilent gives you greater insight and greater confidence into Cellular.

Brochure 2012-05-31

PDF PDF 1.37 MB
Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance 
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Dossier de presse 2012-05-01

 
High-Speed Data Throughput Test 
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

Dossier 2011-11-29

 
Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks 
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Notes d’application 2011-06-15

PDF PDF 595 KB
Langues 
N9076A & W9076A 1xEV-DO X-Series Measurement Application, Self-Guided Demonstration 
This demonstration guide provides step-by-step instructions to analyze power and modulation for forward link and modulation accuracy for reverse link.

Démonstration de base 2011-06-10

PDF PDF 2.97 MB
N9072A & W9072A cdma2000/cdmaOne X-Series Measurement Application Technical Overview 
The N9072A & W9072A cdma2000/cdmaOne X-Series measurement application transforms the X-Series signal analyzers into standards-based transmitter testers.

Présentation technique 2011-05-20

PDF PDF 610 KB
Agilent Technologies Now Supports Real-Time Fading with PXB and Wireless Communications Test Set  
Agilent Technologies Inc. (NYSE: A) today introduced a real-time 2G/3G fading solution that features a direct digital connection between the N5106A PXB baseband generator and channel emulator and E5515C 8960 wireless communications test set.

Dossier de presse 2010-09-28

 
1xEV-DO Test and Measurement Solutions 
This Brochure presents Agilent Technologies commitment to provide solutions across the product lifecycle to speed design, development, and manufacturing of 1xEV-DO products.

Brochure 2010-03-29

PDF PDF 815 KB
Agilent R & D Solutions Brochure for Wireless Data Devices 
Speed development of new wireless data devices with Agilent's cost-effective, multi-format R&D test solutions.

Brochure 2010-02-17

PDF PDF 1.61 MB
Agilent Technologies Licenses acticom Robust Header Compression Technology for Verifying VoIP Functi 

Dossier de presse 2008-11-04

 
Agilent Technologies' New Software Options Provide Full Drive Test Functionality on Handheld Ultra M 

Dossier de presse 2008-08-25

 
8960 Wireless Test Set Ensures the Success of Your Wireless Products 
The flexible solution for wireless device development, manufacturing, and repair

Brochure 2008-08-19

PDF PDF 1.07 MB
Agilent Technologies Introduces First One-Box Test Solution for Multicarrier Performance Test of Rel 

Dossier de presse 2008-07-21

 
New 8960 Test Application Options Offer Unique Lab Application Features 
Now the unique test features of lab applications are can be ordered for test applications.

Brochure 2007-08-16

PDF PDF 120 KB
8960 and E6601A Wireless Test Sets Brochure 
For flexible solutions for today’s wireless device development, manufacturing, and repair, use Agilent’s proven 8960 and new E6601A wireless test set.

Brochure 2007-08-07

PDF PDF 766 KB
8960 and E6601A Product Comparison Brochure 
Shows how the 8960 test set for manufacturing test and the E6601A for calibration test compare.

Brochure 2007-07-23

PDF PDF 177 KB
Signal Studio for 1xEV-DO E4438C-404 Technical Overview 
A 4-page overview of the main features, benefits, and ordering information for E4438C Option 404.

Présentation technique 2007-06-12

PDF PDF 203 KB
N5884A 1xEV-DO Enhanced Wireless Test Manager  
This overview highlights the features of Agilent's test automation software for 1xEV-DO devices.

Présentation technique 2007-06-10

PDF PDF 75 KB
E6564C 1xEV-DO Wireless Test Manager 
This document provides an overview of the capabilities of the E6564C WTM, including supported hardware and PC requirements.

Présentation technique 2007-05-28

PDF PDF 111 KB

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