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1xEV-DO Test

High Rate Packet Data System is the official name of the packet data system associated with cdma2000®. However, at the 3GPP2 standards committee, the name used to describe the system was 1x Evolution Data Only, or 1xEV-DO, a name that has been attached to this system throughout the industry.

1xEV-DO requires a network operator to dedicate a single CDMA channel (1.25 MHz) exclusively to packet data traffic. The system uses the same chip rate and emission filters as are used in cdma2000 and IS-95 CDMA systems, so it is spectrally identical to the legacy systems.

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N9072A & W9072A cdma2000/cdmaOne X-Series Measurement Application - Technical Overview 
The cdma2000/cdmaOne measurement application transforms the X-Series signal analyzers into standards-based transmitter testers. This application provides fast, one-button RF conformance measurements.

Technical Overview 2014-05-21

PDF PDF 3.07 MB
E1966A 1xEV-DO Terminal Test Application - Technical Overview 
This technical overview provides the specifications for the E1966A 1xEV-DO test application to verify and ensure the quality of RF performance of these devices.

Technical Overview 2014-05-19

Accelerate PXI VSA Measurements with X-Series Measurement Applications for Modular Instrument 
This brochure describes the modular X-Series measurement applications which increase the efficiency and capability of the PXI VSA for specific communications standards

Brochure 2014-03-06

PDF PDF 1.31 MB
Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

 
E6640A EXM Wireless Test Set - Configuration Guide  
This configuration guide explains how to order or upgrade the E6640A EXM wireless test set, enabling you to scale the test solution to ramp up rapidly and optimize full-volume manufacturing.

Configuration Guide 2013-12-09

E6640A EXM Wireless Test Set - Flyer  
The EXM wireless test set is scalable to meet your production needs. It delivers the speed, accuracy and port density you need to ramp up rapidly and optimize full-volume manufacturing.

Brochure 2013-11-08

PDF PDF 1.17 MB
Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application  
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2013-08-05

1xEV-DO Applications Feature Comparison 
This table compares key features present in the 8960 1xEV-DO Test and Lab Application products.

Selection Guide 2013-04-18

PDF PDF 351 KB
Accelerate the Development of Wireless Device Tests with Automated Test Development and Support  
This brochure explains how the Agilent Wireless Test Manager products make it easy it to automate test development, expedite time-to-market for wireless devices, and reduce test costs.

Brochure 2012-08-13

PDF PDF 912 KB
EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

Press Materials 2012-08-01

 
E6567E cdma2000/1xEV-DO/LTE Wireless Test Manager - Product Overview 
E6567E wireless test manager supports fast switching between cdma2000, 1xEV-DO, and LTE saving time in test plan development and testing.

Technical Overview 2012-06-01

Greater insight. Greater confidence. Accelerate next-generation wireless - Brochure 
This brochure speaks to Agilent's Cellular from products, to experts to knowledge library and how Agilent gives you greater insight and greater confidence into Cellular.

Brochure 2012-05-31

PDF PDF 1.37 MB
Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance 
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Press Materials 2012-05-01

 
High-Speed Data Throughput Test 
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

Feature Story 2011-11-29

 
Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note 
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Application Note 2011-06-15

N9076A & W9076A 1xEV-DO X-Series Measurement Application, Self-Guided Demonstration 
This demonstration guide provides step-by-step instructions to analyze power and modulation for forward link and modulation accuracy for reverse link.

Demo 2011-06-10

PDF PDF 2.97 MB
Agilent Technologies Now Supports Real-Time Fading with PXB and Wireless Communications Test Set  
Agilent Technologies Inc. (NYSE: A) today introduced a real-time 2G/3G fading solution that features a direct digital connection between the N5106A PXB baseband generator and channel emulator and E5515C 8960 wireless communications test set.

Press Materials 2010-09-28

 
1xEV-DO Test and Measurement Solutions 
This Brochure presents Agilent Technologies commitment to provide solutions across the product lifecycle to speed design, development, and manufacturing of 1xEV-DO products.

Brochure 2010-03-29

PDF PDF 815 KB
8960 R & D Solutions Brochure for Wireless Data Devices - Brochure 
Speed development of new wireless data devices with Agilent's cost-effective, multi-format R&D test solutions.

Brochure 2010-02-17

PDF PDF 1.61 MB
Agilent Technologies Licenses acticom Robust Header Compression Technology for Verifying VoIP Functi 

Press Materials 2008-11-04

 
Agilent Technologies' New Software Options Provide Full Drive Test Functionality on Handheld Ultra M 

Press Materials 2008-08-25

 
8960 Wireless Test Set Ensures the Success of Your Wireless Products - Brochure 
The flexible solution for wireless device development, manufacturing, and repair

Brochure 2008-08-19

PDF PDF 1.07 MB
Agilent Technologies Introduces First One-Box Test Solution for Multicarrier Performance Test of Rel 

Press Materials 2008-07-21

 
New 8960 Test Application Options Offer Unique Lab Application Features - Brochure 
Now the unique test features of lab applications are can be ordered for test applications.

Brochure 2007-08-16

PDF PDF 120 KB

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