Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
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- Application Note (8)
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1-8 of 8
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Solutions for Characterizing Complex and Multi-Stage Circuits
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.
Application Note 2010-04-07 |
PDF
577 KB
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Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.
Application Note 2010-03-04 |
PDF
2.68 MB
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Solutions for Memory Effects in Microwave Components
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.
Application Note 2010-05-13 |
PDF
314 KB
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Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.
Application Note 2012-08-30 |
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Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.
Application Note 2012-08-30 |
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Techniques for Precise Measurement Calibrations in the Field - Application Note
This app note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.
Application Note 2012-08-30 |
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Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.
Application Note 2013-03-05 |
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Understanding X-parameter Nonlinear Measurements
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.
Application Note 2010-01-06 |
PDF
373 KB
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