Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
Refine the List
remove all refinementsBy Application
- RF & Baseband R&D LTE Design and Test Equipment (3)
- Verification, Integration, Protocol and Conformance of LTE Equipment (3)
- Installation & Maintenance of LTE Equipment (3)
- TD-LTE Design and Test Equipment (2)
By Type of Content
- Seminar (2)
- Webcast - recorded (6)
By Product Category
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Additional Test & Measurement Products
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GPIB, USB, Accessories, Racks
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RF & Microwave Test Accessories
- New RF and Microwave Test Accessories (2)
- RF & Microwave Electromechanical Switches (2)
- RF & Microwave Solid State Switches (2)
- PXI Microwave Switches (2)
- Harmonic Mixers (2)
- Attenuator/Switch Drivers (3)
- Attenuators, Fixed (2)
- Attenuators, Variable (2)
- Adapters and Connectors (2)
- Amplifiers (4)
- DC Blocks (2)
- Detectors (2)
- Directional Couplers & Bridges (2)
- Power Dividers & Splitters (2)
- Power Limiters (2)
- RF Probes (2)
- Frequency Meters (2)
- Terminations (Loads) (2)
- Waveguide Accessories (2)
- Bias Networks (2)
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RF & Microwave Test Accessories
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Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia
Seminar |
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A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010
Webcast - recorded |
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Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Original broadcast December 4, 2012
Webcast - recorded |
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Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012
Webcast - recorded |
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LTE Protocol Primer
Recording of June 25, 2008 webcast available on CD.
Webcast - recorded |
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RF and Microwave Education Series
2013 Webcast Series
Webcast - recorded |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
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Understanding Cross Modulation Effects in a Full Duplex LTE Transceiver
Originally broadcast July 22, 2010
Webcast - recorded |
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