Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
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Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices
Original broadcast Oct 28, 2008. Webcast slides available for download only.
Webcast - recorded
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD
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