Long Term Evolution - LTE Test
Greater insight. Greater confidence. Accelerate next-generation wireless.
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
What's New
- Order the new LTE and LTE-Advanced & WLAN Design & Test 2013 DVD
- Announcing Second Edition LTE and LTE-Advanced Book
- Download New App Note: Solutions and Measurement Tools for Use in Power and Envelope Tracking Design
- Learn about new LTE-Advanced 8x8 MIMO Signal-Generation and Analysis solutions
- New HSPA+ app note available - Concepts and Measurements of HSPA+ Evolution
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By Application
- RF & Baseband R&D LTE Design and Test Equipment (1)
- Verification, Integration, Protocol and Conformance of LTE Equipment (1)
- Installation & Maintenance of LTE Equipment (1)
- TD-LTE Design and Test Equipment (1)
By Type of Content
- Seminar (1)
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Generators, Sources, Supplies
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Data Generators & Analyzers
- 81160A Pulse Function Arbitrary Noise Generator (1)
- Transition Time Converters (1)
- 81110A Pulse Pattern Generator, 165/330 MHz (1)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (1)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (1)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (1)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (1)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (1)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (1)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (1)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (1)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (1)
- 81150A Pulse Function Arbitrary Noise Generator (1)
- N2102B PXIT Pattern Generator (1)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (1)
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
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