Long Term Evolution - LTE Test
Accelerate Wireless Design and Test with Flexible, High-Performance Platforms
Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.
To learn more about LTE technology : LTE Technology Overview
To learn more about the LTE implementation of MIMO: MIMO Test
Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
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- RF & Baseband R&D LTE Design and Test Equipment (1)
- Verification, Integration, Protocol and Conformance of LTE Equipment (1)
- Installation & Maintenance of LTE Equipment (1)
- TD-LTE Design and Test Equipment (1)
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Generators, Sources, Supplies
Data Generators & Analyzers
- 81110A Pulse Pattern Generator, 165/330 MHz (1)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (1)
- Transition Time Converters (1)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (1)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (1)
- 81150A Pulse Function Arbitrary Noise Generator (1)
- 81160A Pulse Function Arbitrary Noise Generator (1)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (1)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (1)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (1)
- M8020A J-BERT High-Performance BERT Configuration for Bench-Top 5-Slot Chassis (1)
- N2102B PXIT Pattern Generator [Discontinued] (1)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (1)
- Data Generators & Analyzers
- Generators, Sources, Supplies
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Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD
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