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Cellular
Agilent Technologies, the world’s premier measurement company, offers a full range of design, test, and management solutions that span the range of cellular technologies—from legacy 1G systems through 3G systems such as HSPA to 3GPP Long Term Evolution (LTE) and 1xEV-DO. Agilent products cover the lifecycle from early design and development, through volume manufacturing, to network deployment and service assurance. See the Quick Guide to Agilent’s Solutions for High-Speed Cellular for an overview of all technologies and supporting product families. To learn more about related technologies consult MIMO Test and Wireless Connectivity. Greater insight. Greater confidence. Accelerate next-generation wireless.
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- Long Term Evolution - LTE (8)
- HSPA & HSPA+ (4)
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- Application Note (12)
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1-12 of 12
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Solutions for Active Device Test
This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.
Application Note 2009-05-05 |
PDF
569 KB
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Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.
Application Note 2009-08-21 |
PDF
366 KB
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Solutions for Characterizing Complex and Multi-Stage Circuits
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.
Application Note 2010-04-07 |
PDF
577 KB
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Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.
Application Note 2010-03-04 |
PDF
2.68 MB
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Solutions for Memory Effects in Microwave Components
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.
Application Note 2010-05-13 |
PDF
314 KB
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Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.
Application Note 2012-08-30 |
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Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.
Application Note 2012-08-30 |
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Techniques for Precise Measurement Calibrations in the Field - Application Note
This app note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.
Application Note 2012-08-30 |
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Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.
Application Note 2013-03-05 |
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Testing and Troubleshooting Digital RF Communications Receiver Designs (AN 1314)
This Application Note covers the fundamental measurement principles involved in testing and troubleshooting digital communications
receivers, particularly those used in digital RF cellular systems. Measurement setups are provided for receiver performance tests and
troubleshooting tips are given.
Application Note 2002-03-25 |
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Testing CDMA Base Station Amplifiers (AN 1307)
The objective of this Application Note is to cover the basic measurement fundamentals of characterizing the linear and non-linear
behavior of CDMA power amplifiers.
Application Note 2000-05-01 |
PDF
523 KB
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Understanding X-parameter Nonlinear Measurements
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.
Application Note 2010-01-06 |
PDF
373 KB
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