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Cellular

Agilent Technologies, the world’s premier measurement company, offers a full range of design, test, and management solutions that span the range of cellular technologies—from legacy 1G systems through 3G systems such as HSPA to 3GPP Long Term Evolution (LTE) and 1xEV-DO. Agilent products cover the lifecycle from early design and development, through volume manufacturing, to network deployment and service assurance. See the Quick Guide to Agilent’s Solutions for High-Speed Cellular for an overview of all technologies and supporting product families. To learn more about related technologies consult MIMO Test and Wireless Connectivity. Greater insight. Greater confidence. Accelerate next-generation wireless.

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  - Application Note (9)

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Generators, Sources, Supplies (4)
- Signal Generators (Signal Sources) (4)
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- Wireless Device Test Sets & Wireless Solutions (4)

1-9 of 9

Applications Testing with the Agilent 8960 Series 10 Wireless Test Set (R&D only) The 8960 (E5515C) and Agilent lab applications help you throroughly test to current technology standards. Application Note 2006-03-27	PDF 687 KB Languages English \| 2006-03-27 \| PDF 687 KB 日本語 \| 2006-08-02 \| PDF 1.08 MB 한국어 \| 2006-03-27 \| PDF 687 KB
E4438C Signal Studio for 1xEV-DO Application Note This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO. Application Note 2003-06-13	PDF 2.37 MB
E443xB Signal Studio for 1xEV-DO Application Note This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO. Application Note 2002-01-31	PDF 1.69 MB Languages English \| 2002-01-31 \| PDF 1.69 MB 日本語 \| 2002-05-29 \| PDF 1.99 MB
E443xB Signal Studio for 1xEV-DO Product Overview This 2-page product overview contains the main features, benefits, and ordering information for Option 404 for the E443xB. Application Note 2002-01-31	PDF 187 KB Languages English \| 2002-01-31 \| PDF 187 KB 日本語 \| 2002-05-29 \| PDF 403 KB
EXT Wireless Communications Test Set Non-signaling Test Overview This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies Application Note 2012-08-01	PDF 290 KB
Forward Link Measurements for 1XEV-DO Access Networks (AN 1398) Application Note 2002-11-11	PDF 1.20 MB
How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns. Application Note 2005-08-15	PDF 90 KB Languages English \| 2005-08-15 \| PDF 90 KB 日本語 \| 2007-01-29 \| PDF 276 KB 한국어 \| 2005-08-15 \| PDF 90 KB
Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution. Application Note 2011-06-15	PDF 595 KB Languages English \| 2011-06-15 \| PDF 595 KB 中文（简体） \| 2011-06-15 \| PDF 595 KB 日本語 \| 2011-08-31 \| PDF 1.14 MB
Understanding Measurement of 1xEV-DO Access Terminals (AN 1414) Basic concepts of 1xEV-DO, Forward link receiver measurements, Reverse link, and more... Application Note 2004-12-10	PDF 1.64 MB Languages English \| 2004-12-10 \| PDF 1.64 MB 日本語 \| 2003-03-03 \| PDF 2.41 MB