Cellular
Agilent Technologies, the world’s premier measurement company, offers a full range of design, test, and management solutions that span the range of cellular technologies—from legacy 1G systems through 3G systems such as HSPA to 3GPP Long Term Evolution (LTE) and 1xEV-DO. Agilent products cover the lifecycle from early design and development, through volume manufacturing, to network deployment and service assurance. See the Quick Guide to Agilent’s Solutions for High-Speed Cellular for an overview of all technologies and supporting product families. To learn more about related technologies consult MIMO Test and Wireless Connectivity. Greater insight. Greater confidence. Accelerate next-generation wireless.
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- Long Term Evolution - LTE (2)
- LTE-Advanced (LTE-A) (2)
- HSPA & HSPA+ (2)
- W-CDMA (2)
- TD-SCDMA (2)
- GSM, GPRS, EGPRS & Evolved Edge (2)
- 1xEV-DO (2)
- cdma2000 / CDMA (2)
- Mobile Computing - MIPI (5)
- Femtocell (2)
- GNSS & A-GNSS (2)
- TDMA (2)
- 1G - Analog Technologies (2)
By Type of Content
- Training Materials (1)
- Seminar (2)
- Webcast - recorded (2)
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Generators, Sources, Supplies
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Data Generators & Analyzers
- 81160A Pulse Function Arbitrary Noise Generator (2)
- Transition Time Converters (2)
- 81110A Pulse Pattern Generator, 165/330 MHz (2)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (2)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (2)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (2)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (2)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (2)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (2)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (3)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (4)
- 81150A Pulse Function Arbitrary Noise Generator (4)
- N2102B PXIT Pattern Generator (2)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (2)
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Data Generators & Analyzers
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Generators, Sources, Supplies
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Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia
Seminar |
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Digital and Photonics Webcast Series
Originally broadcast 2010, 2011. Access the recordings of many broadcasts
Webcast - recorded |
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
Webcast - recorded |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
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View the recorded webcast - Introduction to MIPI device test
Introduction to MIPI device test
Training Materials 2011-11-08 |
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