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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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10 Practical Tips You Need to Know about Your Power Products 
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads.

Application Note 2007-09-21

PDF PDF 708 KB
Languages 
4 Steps for Making Better Power Measurements (AN 64-4D) 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

PDF PDF 995 KB
Languages 
71910A/P Wideband Receiver Product Note 
Two-page product note describes how to measure complex signals in digital communications satellite test with wideband spectrum analysis and modulation analysis tools. Containsapplications and additional information.

Application Note 2000-09-01

PDF PDF 281 KB
Airframe Testing (AN 1270-8) 
Hundreds of strain and stress points on an airframe and wings are measured with a high-speed Agilent VXI Data Acquistion System. Description A newly designed aircraft must be thoroughly tested before it can be flown. Hydraulic stress testing is a common technique for checking the strength and...

Application Note 1995-06-01

PDF PDF 70 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
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Choosing Your Test System Software Architecture (AN 1465-4) 

Application Note 2004-12-21

PDF PDF 409 KB
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

PDF PDF 175 KB
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Modifying a GPIB System to Include LAN/LXI (AN 1465-26)  
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Application Note 2007-05-10

PDF PDF 271 KB
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Spectrum Analyzer Basics (AN 150) 
Fundamentals of spectrum analyzer measurements

Application Note 2006-08-02

PDF PDF 3.71 MB
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Switching Solutions 
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

PDF PDF 840 KB
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

PDF PDF 182 KB
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

PDF PDF 290 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB