Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
What's New
- Enabling Simulation and Test of Custom OFDM Signals
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Understanding Phase Noise Needs and Choices in Signal Generation
- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
- Radar, EW, ELINT Test Challenges article reprint
Refine the List
By Application
By Type of Content
- Document Library
- Application Notes
- Application Note (6)
- Application Notes
By Product Category
-
All Product Categories
-
Additional Test & Measurement Products
- Photonic Test & Measurement Products
-
Additional Test & Measurement Products
1-6 of 6
|
Converting ATE Control from Agilent 83480A to 86100A (PN 86100-1)
This application note gives you information about the 86100A syntax changes and new or enhanced commands. It also tells you the 83480A commands which are not supported by the 86100A.
Application Note 2000-02-01 |
|
|
Lightwave Signal Analyzers Measure Relative Intensity Noise (PN 71400-1)
This product note describes techniques to measure laser intensity noise with the Agilent 714000C and 71410C lightwave signal analyzers. It includes RIN examples and measurements.
Application Note 2000-07-01 |
|
|
Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.
Application Note 2002-03-11 |
|
|
Spectrum Analysis: Amplitude and Frequency Modulation (AN 150-1)
Modulation is the act of translating some low-frequency or base-band signal (voice, music, data) to a higher frequency. Why do we modulate signals? There are at least two reasons: to allow the simultaneous transmission of two or more baseband signals by translating them to different frequencies...
Application Note 2001-10-01 |
|
|
Variable Optical Attenuator in BER Test Applications
This application note will help users of optical attenuators to understand the key features of Agilent’s new attenuator family.
Application Note 2001-08-23 |
|
|
WDM System Test with the Agilent 86120 Multi-Wavelength Meter ( PN 86120-1)
This product note addresses the WDM system, the design and maintenance issues warranting measurement, and how the Agilent 86120 Multi-Wavelength Meter can be used to easily...
Application Note 2000-08-01 |
|
