Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
What's New
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Enabling Simulation and Test of Custom OFDM Signals
- Understanding Phase Noise Needs and Choices in Signal Generation
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- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
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Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.
Application Note 2008-03-10 |
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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Switching Solutions
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.
Application Note 2010-11-18 |
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
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Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.
Application Note 2010-05-21 |
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