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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

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8753/8720 Pulsed Measurements 
The aim of this Product Note is to show that under certain conditions, network analyzers such as the Agilent 8720ES and 8753ES can produce good results at a much lower cost.

Application Note 2000-05-01

PDF PDF 392 KB
A New Gated-CW Radar Implementation 
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.

Application Note 2004-03-03

PDF PDF 154 KB
Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense Applications  
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2011-05-04

Analyzing Infiniium Scope Radar Waveform with ADS 
This AN focuses on using both Agilent test and measurement instruments such as oscilloscopes, signal generators, and signal analyzers to solve a common design problems of wireless and wireline communications products.

Application Note 2003-12-01

Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19) 

Application Note 2005-10-31

Characterizing Barker Coded Modulation in Radar Systems (AN 358-10) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1989-10-01

PDF PDF 721 KB
Characterizing Chirp Coded Modulation in Radar Systems (AN 358-11) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1990-01-01

PDF PDF 647 KB
Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit 
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

Cheetah PNA RCS and Antenna Measurement System 
Introducing a radar measurement system based on Agilent's PNA network analyzer. Reprinted with permission of SPC Corp.

Application Note 2004-03-03

PDF PDF 582 KB
Continuous Monitoring of Radar Noise Figures (AN 43) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1964-12-01

PDF PDF 900 KB
Creating a Complete and Flexible Solution for WiGig Testing Application Note 
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz

Application Note 2011-06-13

Creating a Radar Threat Simulator and Receiver Calibrator with Precise Angle of Arrival  
This application brief focuses on a solution for radar testing and covers three key topics: the problem, the solution, and the associated results and benefits.

Application Note 2011-06-20

PDF PDF 1.66 MB
Creating and Analyzing Custom OFDM Waveforms for Software-Defined Radio (SDR) 
This note outlines the complexities of generating and analyzing COTS and custom waveforms, proposes solutions that address those problems, and presents the results of the suggested approaches.

Application Note 2012-12-14

PDF PDF 483 KB
Designing, Verifying and Testing Stepped Frequency Radar Systems for Commercial and A/D Applications 
This note shows a simulation platform using SystemVue software that easily links measurement tools to enable the design, validation and test of SFR systems under different environments.

Application Note 2012-10-18

PDF PDF 688 KB
EPM-P Series Power Meters Used in Radar and Pulse Applications (AN 1438) 

Application Note 2003-01-28

Evaluating and Optimizing High-power Amplifier Designs with X-Parameter Techniques 
This brief presents an example PA design that uses a 45-watt GaN transistor. The center operating frequency is 1.2 GHz and the target output power is 45 dBm or more.

Application Note 2011-04-28

Fundamentals of Time Interval Measurements (AN 200-3) 
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1997-06-01

Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio 
Better noise-figure measurements enhance characterization of excess noise in receivers.

Application Note 2011-05-05

Low Cost Radar Verification Testing with USB Sensor-Based Scalar Network 
Perform accurate measurements of RF and microwave power.

Application Note 2011-07-28

Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1989-10-01

PDF PDF 713 KB
Optimizing Throughput in Transmit/Receive Module Test 
This application brief illustrates modern trends of testing by focusing on transmit/receive (T/R) modules used in radar systems.

Application Note 2011-04-12

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

Pulsed Carrier Phase Noise Measurements (AN 1309) 
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.

Application Note 2000-05-01

PDF PDF 632 KB
Radar Emitter Simulation Using the E8267C PSG Vector Signal Generator 
This 32-page application note explains how to generate and evaluate complex radar signals using the Agilent E8267C vector signal generator.

Application Note 2003-12-01

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