Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
What's New
- Enabling Simulation and Test of Custom OFDM Signals
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Understanding Phase Noise Needs and Choices in Signal Generation
- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
- Radar, EW, ELINT Test Challenges article reprint
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Spectrum Analyzers (Signal Analyzers)
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Oscilloscopes, Analyzers, Meters
1-4 of 4
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Making Wideband Measurements Application Note
This paper will discuss using the Agilent PXA signal analyzer as a microwave down converter for an Infiniium oscilloscope or Acqiris digitizer running the 89600 VSA software.
Application Note 2012-01-24 |
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements
Application Note 2006-08-02 |
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Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.
Application Note 2012-07-05 |
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Spectrum and Signal Analyzer Measurements and Noise Application Note 1303
Noise is the classical limitation of electronics. In this application note, the characteristics of noise and its direct measurement are discussed in detail.
Application Note 2012-05-04 |
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