Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
Novedades
- Enabling Simulation and Test of Custom OFDM Signals
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Understanding Phase Noise Needs and Choices in Signal Generation
- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
- Radar, EW, ELINT Test Challenges article reprint
Redefinir la lista
eliminar toda la selecciónPor Aplicación
- Radar Test & Electronic Warfare (EW) Test (39)
- Military Communications (23)
- Satellites (39)
- Signals Intelligence (SIGINT) (15)
- Avionics, Guidance, Navigation & GPS (9)
- ATE Applications (33)
- Operational Test (10)
Por Tipo de Contenido
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Nota de aplicación
- Nota de aplicación
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Nota de aplicación
Por Categoría de Producto
126-150 de 152
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Nota de aplicación 2004-12-09 |
PDF
189 KB
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Test-System Development Guide: Operational Maintenance (AN 1465-8)
Nota de aplicación 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Nota de aplicación 2004-12-21 |
PDF
374 KB
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Testing and Troubleshooting Digital RF Communications Receiver Designs (AN 1314)
This Application Note covers the fundamental measurement principles involved in testing and troubleshooting digital communications
receivers, particularly those used in digital RF cellular systems. Measurement setups are provided for receiver performance tests and
troubleshooting tips are given.
Nota de aplicación 2002-03-25 |
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The Real “Total Cost of Ownership” of Your Test Equipment
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.
Nota de aplicación 2010-09-30 |
PDF
1.14 MB
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Three Reasons to Migrate From Your 8662A/8663A to the E8663D RF Signal Generator
This application note demonstrates the advantages of the E8663D over the 8662A/8663A, giving you three compelling reasons to migrate: superior performance, enhanced usability, and modern supportability.
Nota de aplicación 2009-10-22 |
PDF
1.33 MB
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Typical GPS Receiver Verification Tests Using a GPS Signal Simulator - Application Note
This paper describes typical GPS receiver verification tests using a GPS signal simulator. The tests are used to verify functionality of embedded GPS receivers in mobile consumer products such as cell phones and other handheld receivers.
Nota de aplicación 2010-03-04 |
PDF
355 KB
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Ultra-wideband Communication RF Measurements
Nota de aplicación 2004-05-21 |
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Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.
Nota de aplicación 2010-05-21 |
PDF
1.07 MB
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
Nota de aplicación 2004-12-21 |
PDF
235 KB
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Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.
Nota de aplicación 2012-01-24 |
PDF
3.01 MB
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Using EVM Measurements to Analyze and Troubleshoot Vector-Modulated Signals (PN 89400-14)
This Product Note reviews the basics of EVM measurements on the 89400 vector signal analyzers, and outlines a general procedure that may be used to methodically track down even the most obscure signal problems.
Understanding Error Vector Magnitude
EVM Defined
Making EVM...
Nota de aplicación 2000-10-01 |
PDF
205 KB
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Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443)
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.
Nota de aplicación 2008-05-22 |
PDF
1.19 MB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
Nota de aplicación 2004-09-14 |
PDF
182 KB
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
Nota de aplicación 2004-07-29 |
PDF
270 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
Nota de aplicación 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
Nota de aplicación 2005-03-29 |
PDF
263 KB
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Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.
Nota de aplicación 2007-05-08 |
PDF
303 KB
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Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20)
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.
Nota de aplicación 2006-01-17 |
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Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.
Nota de aplicación 2009-09-03 |
PDF
1.11 MB
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
Nota de aplicación 2004-12-13 |
PDF
408 KB
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.
Nota de aplicación 2006-08-28 |
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Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification
Agilent's Radar Library helps you with the productivity and accuracy of your radar signals.
Nota de aplicación 2011-01-25 |
PDF
3.20 MB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
Nota de aplicación 2004-11-19 |
PDF
194 KB
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Variable Optical Attenuator in BER Test Applications
This application note will help users of optical attenuators to understand the key features of Agilent’s new attenuator family.
Nota de aplicación 2001-08-23 |
PDF
409 KB
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