Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
Nouveautés
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Enabling Simulation and Test of Custom OFDM Signals
- Understanding Phase Noise Needs and Choices in Signal Generation
- myAgilent personalized portal available. Learn more and register now!
- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
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Toutes les applications
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Toutes les catégories de produit
- Oscilloscopes, Analyzers, Meters
1-5 sur 5
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Aerospace/Defense RF Coaxial Cable Test - Beta LaserMike
Aerospace/Defense RF Coaxial Cable Test from Beta LaserMike and Agilent.
Brefs de solution 2013-01-26 |
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COTS-Based Functional ATE – G Systems
Commercial-off-the-Shelf (COTS) based Automated Functional Test Solutions from G Systems and Agilent.
Brefs de solution 2012-05-10 |
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RF Module Test Solution for Speed, Accuracy and Performance – Auriga Microwave
RF Module Test Solution for Speed, Accuracy and Performance from Auriga Microwave and Agilent
Brefs de solution 2012-03-01 |
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RF Test Solutions – WinSoft
Military and Commercial RF Test Solutions from WinSoft and Agilent.
Brefs de solution 2012-05-14 |
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S-Parameter Measurements on Multiport Devices – In-Phase Technologies
S-Parameter Measurements on Multiport Devices from In-Phase Technologies and Agilent
Brefs de solution 2012-02-24 |
