Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
What's New
- Cost savings in creating realistic multi-emitter signal scenarios – application note
- Updated: Agilent radar measurements - application note
- Updated: Agilent radar, EW & ELINT testing: Identifying common test challenges - application note
- Using RF recording techniques to resolve interference problems - application note
- Enabling Simulation and Test of Custom OFDM Signals
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retirer tout le raffinementPar application
- Radar Test & Electronic Warfare (EW) Test (4)
- Military Communications (4)
- Satellites (4)
- Signals Intelligence (SIGINT) (2)
- Avionics, Guidance, Navigation & GPS (2)
- ATE Applications (2)
- Operational Test (3)
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Generators, Sources, Supplies
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Data Generators & Analyzers
- 81160A Pulse Function Arbitrary Noise Generator (2)
- Transition Time Converters (2)
- 81110A Pulse Pattern Generator, 165/330 MHz (2)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (2)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (2)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (2)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (2)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (2)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (2)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (2)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (4)
- 81150A Pulse Function Arbitrary Noise Generator (3)
- N2102B PXIT Pattern Generator (3)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (2)
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Evénements Agilent en France
Bienvenue sur la page des événements auxquels participe Agilent en France
Seminar |
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Digital and Photonics Webcast Series
Originally broadcast 2010, 2011. Access the recordings of many broadcasts
Webcast - recorded |
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
Webcast - recorded |
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PXI, AXIe, DAQ and Modular Solutions Webcast Series
Live and on-demand webcasts, various dates in 2012
Webcast |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
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USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast
Original broadcast June 13, 2013
Webcast - recorded |
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