NFC / RFID Test
Near Field Communication (NFC) standards cover communications protocols and data exchange formats, and are based on existing short range HF technologies working at 13.56 MHz. NFC Technology is already present in most popular electronic devices like smartphones, other devices may become NFC enabled soon. Studies say the adoption trend will continue and soon millions of individual will have at hand a NFC enabled device to interact to other NFC infrastructure devices (transport, retail, payment, entertainment, etc) and therefore access to new services. To guarantee a successful roll out, compliance and IOT must be granted. Some initiatives like NFC Forum have developed already technical specs and test specs that enable different developers to successfully test and certify their NFC devices.
Radio Frequency Identification (RFID) technology provides the ability to track the placement and movement of objects. While RFID has been touted as the next evolution in consumer goods supply-chain management, new applications for this technology are quickly emerging.
As a world leader in test and measurement solutions, Agilent Technologies offers an extensive set of modeling, development and test tools (pre-conformance and conformance) that help ensure the quality of RFID systems and components. Greater insight. Greater confidence. Accelerate next-generation wireless.
Refine the List
By Type of Content
- Seminar (1)
- Webcast - recorded (4)
By Product Category
-
All Product Categories
-
Software
- Agilent EEsof EDA Software (2)
- Application Software for Instruments (4)
- Instrument Control Software (2)
- 89600 VSA Software (2)
- Agilent VEE (1)
- Interactive Functional Test (IFT) Software (1)
- Wireless Test Managers (1)
- EasyEXPERT software and Desktop EasyEXPERT software (1)
- Calibration & Adjustment Software (1)
- Agilent License Manager (1)
-
Software
1-5 of 5
|
Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Original broadcast December 4, 2012
Webcast - recorded |
|
|
Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012
Webcast - recorded |
|
|
Innovations in EDA: Memory Effects in RF Circuits: Manifestations and Simulation
Originally broadcast Feb 3, 2011
Webcast - recorded |
|
|
Multi-Signal, Multi-Format Analysis with the 89600 VSA
Original broadcast Apr 25, 2012
Webcast - recorded |
|
|
Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
