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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Signal Integrity eSeminar Series Q&A: Being Successful with Fully Buffered DIMM (FBD) Designs 
The following Questions and Answers were created from the live eSeminar broadcast of January 25, 2005. You can view the archived eSeminar by going to

Seminar Materials 2005-01-25

PDF PDF 60 KB
Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation 
Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.

Webcast - recorded

 
Simulation-Measurement Workflow for DDR Compliance Webcast 
Original broadcast March 27, 2014

Webcast - recorded

 
Simultaneous Switching Noise Analysis in DDR4 applications using Power-Aware IBIS Models Webcast 
Original broadcast May 22, 2014

Webcast - recorded

 
Solving New High-Speed Design Challenges with ADS 2013.06 
In this seminar, leading Agilent EEsof R&D Designers provide a first-hand look at the new HSD features for the world class ADS transient and channel convolution simulators.

Seminar Materials 2013-07-10

 
Solving Real World Jitter Problems for High-Speed Communications eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 53 KB
Successful High Speed Digital Design with ADS, EMPro, and SystemVue 
The materials in this self-guided workshop will show you the latest high speed digital capabilites in ADS 2011.

Seminar Materials 2011-09-29

 
Successful High-Speed Digital Design for PC board using ADS 
A hands-on workshop on how to solve increasingly difficult signal integrity and power integrity challenges using Advanced Design System.

Seminar Materials 2014-02-27

 
Switching Solution Webcast 
Original broadcast December 16, 2013

Webcast - recorded

 
TDR vs. VNA Interconnect Characterization eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 18 KB
Test and Validation of PCIe/NVMe Protocol Designs Webcast 
Original broadcast July 10, 2014

Webcast - recorded

 
Testing Receiver Jitter Tolerance eSeminar FAQs 
Testing Receiver Jitter Tolerance eSeminar FAQs

Seminar Materials 2006-06-14

PDF PDF 50 KB
Tips to Debugging DDR 1, 2 and 3 Physical and Protocol Layer Issues webcast 

Training Materials 2009-01-06

 
Tutorials in Signal Integrity Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 
USB Test Challenges: Fast and Accurate Receiver Characterization Webcast 
Original broadcast July 16, 2014

Webcast - recorded

 
Using IBIS AMI Models as ‘Executable Data sheets’ in High Speed Digital Interconnect Simulations 
Originally broadcast Sept 9, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.

Webcast - recorded

 
Using Logic Analysis to Find Root Cause of Digital Design Errors Webcast 
Recorded broadcast December 17, 2013

Webcast - recorded

 
Webcast: Do You Have What it Takes to Test HDMI 2.0? 
Original broadcast March 12, 2014

Webcast - recorded

 
Why Do Measurement-based Channel Modeling? 
Adobe .pdf of the paper presented at the High-Speed Digital Seminar, Ensuring MultiGigabit Design Success

Seminar Materials 2008-01-20

PDF PDF 3.62 MB

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