High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
Navigate the entire design cycle
Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
-
U4154A 4 Gb/s AXIe-based Logic Analyzer Module
U4154A 4 Gb/s AXIe-based Logic Analyzer Module
The U4154A AXIe-based logic analyzer module provides confidence in state measurements up to 4 Gb/s on signals with eye openings as small as 100 ps by 100 mV.
-
M8190A 12 GSa/s Arbitrary Waveform Generator
M8190A 12 GSa/s Arbitrary Waveform Generator
Agilent's M8190A - An Agilent AWG is the source of greater fidelity, delivering high resolution and wide bandwidth – simultaneously
-
N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance
N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance
J-BERT N4903B High-performance Serial BERT. The only complete jitter tolerance test – now for next generation of forwarded and embedded clock designs such as QPI, HyperTransport, PCIe(TM), DisplayPort, SATA, USB, FB-DIMM, Fibre Channel, 10GbE
-
N5454A Segmented memory acquisition for InfiniiVision Series oscilloscopes
N5454A Segmented memory acquisition for InfiniiVision Series oscilloscopes
Segmented memory acquisition software
-
E5071C-TDR Enhanced Time Domain Analysis
E5071C-TDR Enhanced Time Domain Analysis
Agilent E5071C ENA Option TDR provides a one-box solution for high speed serial interconnect analysis for S-parameter, TDR, and eye diagram measurements.
