High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
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- Signal Integrity (16)
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By Type of Content
- Document Library
- Application Notes
- Application Note (102)
- Application Notes
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51-75 of 102
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
Application Note 2005-11-01 |
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2.83 MB
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Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6)
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.
Application Note 2002-05-30 |
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600 KB
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Low Voltage Differential Signaling, (AN 1382-6)
Using LVDS for High Speed Data Transmission
Application Note 2001-12-17 |
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2.53 MB
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
Application Note 2011-07-08 |
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1.77 MB
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
Application Note 2000-11-01 |
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426 KB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
Application Note 2008-01-30 |
PDF
1.91 MB
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Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...
Application Note 2000-06-01 |
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102 KB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Application Note 2008-08-18 |
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1.87 MB
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Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3)
A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes.
Application Note 2000-11-01 |
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1.84 MB
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
Application Note 2009-06-01 |
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Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
Application Note 2004-06-01 |
PDF
671 KB
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Next Generation I/O Bus PCI Express BER Test Solution
PCI Express increases data transport efficiency and data quality. It uses an 8b/10b encoding methodology to embed the clock signal ...
Application Note 2005-05-25 |
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2 MB
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On-Chip Design Verification with Xilinx FPGAs
Xilinx Virtex-II Pro devices have redefined FPGAs.
Application Note 2003-04-30 |
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65 KB
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Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.
Application Note 2000-09-01 |
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1.04 MB
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PCI Express Receiver Design Validation Test with 81134A / 81250A
Describes functional validation and compliance and stress tests for PCI Express receiver design
Application Note 2005-03-18 |
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2.01 MB
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
Application Note 2011-10-28 |
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1.01 MB
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PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.
Application Note 2006-01-30 |
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Planning Your Design for Debug: FPGA Dynamic Probe
Application Note 2005-01-26 |
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Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs
Application Note 2009-06-01 |
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163 KB
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.
Application Note 2007-03-07 |
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1.64 MB
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Precision Jitter Transmitter
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.
Application Note 2005-06-20 |
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387 KB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
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387 KB
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
Application Note 2011-07-28 |
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651 KB
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Quick Identification of Periodic Jitter Sources (AN 1200-4)
The Agilent 53310A is an easy-to-use, inexpensive tool for displaying time interval measurements versus time. Any repetitive pattern in the jitter is immediately apparent. The 53310A's analysis features readily give peak-to-peak and periodic rate information. Taking all of these clues together...
Application Note 2000-08-01 |
PDF
90 KB
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S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.
Application Note 2012-08-21 |
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