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每一代數位標準的變化,都會帶來新的產品設計風險。藉由與業界專家以及像您這樣的工程師共同合作,我們得以取得第一手資訊並順利開發產品。 安捷倫高速數位測試解決方案建構於我們不斷與業界專家進行溝通交流的量測技術與專業知識之上。 藉由與您分享我們最先進的量測專業知識,安捷倫可協助您順利克服挑戰,並且加速推出傲視業界的產品。安捷倫是協助您實現最佳設計的推手。

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Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

新聞簡訊 2014-04-10

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

基本展示 2014-03-20

 
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

基本展示 2014-03-20

 
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

型錄 2014-02-20

PDF PDF 6.47 MB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

新聞資料 2014-02-20

 
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement 
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

專文 2014-02-18

PDF PDF 2.99 MB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

專文 2014-02-18

PDF PDF 3.82 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

專文 2014-02-18

PDF PDF 8.07 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies 
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

專文 2014-02-18

PDF PDF 3.28 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

專文 2014-02-18

PDF PDF 947 KB
Mechanism of Jitter Amplification in Clock Channels 
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

專文 2014-02-18

PDF PDF 671 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

專文 2014-02-18

PDF PDF 1.78 MB
Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014 
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Agilent Technologies, at Designcon 2014, .

基本展示 2014-02-04

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

新聞資料 2014-01-27

 
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

應用手冊 2014-01-23

Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014 
Agilent announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs.

新聞資料 2014-01-22

 
Quick Start for Signal Integrity Design Using Advanced Design System (ADS) 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

技術總覽 2014-01-20

PDF PDF 3.80 MB
EDA Support Services 
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

型錄 2013-11-09

PDF PDF 128 KB
Introducing Physics-Based VCSEL Model to Solve Challenges in Designing Rack-to-Rack Opto Links 
Agilent introduces a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links.

新聞資料 2013-10-23

 
Agilent RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Agilent EEsof software design tools and Agilent instruments.

型錄 2013-10-16

PDF PDF 640 KB
Agilent Technologies’ Advanced Design System Selected by Kamstrup to Develop Smart Metering System 
Agilent announces that Kamstrup A/S, a provider of metering solutions for electricity, heat, water and natural gas, has selected Agilent's Advanced Design System (ADS).

新聞資料 2013-10-07

 
Agilent EEsof EDA Premier Communications Design Software 
The Agilent EEsof EDA catalog provides an excellent overview of all of Agilent's Electronic Design Automation (EDA) tools.

目錄 2013-10-07

PDF PDF 8.61 MB
Agilent EEsof EDA Product Overview 
Agilent EEsof EDA premier communications design software product overview brochure.

型錄 2013-09-30

PDF PDF 1.68 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

應用手冊 2013-09-16

PDF PDF 1.78 MB
Agilent EEsof EDA Software and Modular Solutions for Universities 
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

型錄 2013-08-16

PDF PDF 3.80 MB

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