高速數位解決方案
每一代數位標準的變化,都會帶來新的產品設計風險。藉由與業界專家以及像您這樣的工程師共同合作,我們得以取得第一手資訊並順利開發產品。 安捷倫高速數位測試解決方案建構於我們不斷與業界專家進行溝通交流的量測技術與專業知識之上。 藉由與您分享我們最先進的量測專業知識,安捷倫可協助您順利克服挑戰,並且加速推出傲視業界的產品。安捷倫是協助您實現最佳設計的推手。
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請瀏覽產品網頁,以便觀看並尋找在設計週期的四個階段以及執行重要的信號完整度分析所需的解決方案。
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依應用
- 信號完整度 (44)
- 高速數位元件的設計與模擬 (26)
- 高速數位分析 (11)
- 高速數位信號除錯 (3)
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依產品分類
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探索高效能即時示波器的未來趨勢
現場直播:2012 年 4 月 11 日; 10am (美西時間) / 1pm (美東時間)
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案例研究:克服 DDR3/GDDR5 記憶體控制器封裝中回返路徑不連續的問題
原始播放時間為 2011 年 10 月 13 日
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100G TX Designs - Tips & Techniques for Accurate Characterization Webcast
Original broadcast on February 27, 2013
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Accelerating DDR4 Debug and Protocol Validation Webcast
Original webcast February 26, 2013
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Accelerating USB 3.0 Protocol Development
Original broadcast June 27, 2012
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ADMF: Facing the challenges of Super speed USB 3.0 Product Development
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development
研討會講義 2008-11-12 |
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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012
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Analyzing Digital Jitter and its Component eSeminar FAQs
FAQs from the eSeminar
研討會講義 2006-05-11 |
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Application-focused Oscilloscope Measurements – Education Webcast Series
Live broadcasts throughout 2013
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Astonishing Enhancements to Signal Integrity EDA Tools Using Video Game 3D Glasses and GPUs
Originally broadcast Jan 21, 2010
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Breakthrough in High Speed Interconnect Analysis and Compliance Testing
Originally broadcast April 27, 2011
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Building a Precision Jitter Source
Presentation, June 1, 2004
From the Japan Agilent Digital Measurement Forum, this presentation reviews the construction of a precision jitter source for analyzing digital jitter measurements.
研討會講義 2004-06-01 |
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Case Study: Overcoming Return-path Discontinuity in DDR3/GDDR5 Memory Controller Packages
Original broadcast October 13, 2011
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Characterization and Modeling of a High Speed Backplane Differential Channels eSeminar FAQs
FAQs from the eSeminar
研討會講義 2006-05-11 |
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Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope
Originally broadcast July 27, 2011
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Conquering USB 3.0 Physical Layer Test Challenges
Original broadcast June 13, 2012
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Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices
Original broadcast Oct 28, 2008. Webcast slides available for download only.
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Design and Test Challenges in Next Generation High-Speed Serial Standards
Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference.
訓練教材 2011-11-29 |
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Digital and Photonics Webcast Series
Originally broadcast 2010, 2011. Access the recordings of many broadcasts
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
網路廣播 -- 存檔 |
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DisplayPort 1.2 Physical Layer Testing
Original broadcast October 30, 2012
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EDN Editorial Webcast: Signal Integrity and High-Speed Board Design
Originally broadcast Jan 25, 2011
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Effective Crosstalk Characterization Webcast
Original broadcast January 24, 2013
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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO
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Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast
Original broadcast March 20, 2013
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