Contact an Expert

High-Speed Digital

This content requires a browser with JavaScript enabled and the Adobe Flash Player.

Get Flash 

In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

Explore YouTube Videos 

What's New

Related Links

Refine the List

remove all refinements

By Application

By Type of Content

By Product Category

1-10 of 10

Sort:
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

PDF PDF 736 KB
Debugging Parallel RapidIO Designs 

Application Note 2003-01-09

PDF PDF 356 KB
Languages 
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) 
Debugging USB 2.0 Systems

Application Note 2006-10-05

PDF PDF 392 KB
Languages 
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

PDF PDF 416 KB
Languages 
Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems 
Application Note 1575

Application Note 2006-04-14

PDF PDF 120 KB
Languages 
InfiniBand System Level Debugging (AN 1382-1) 
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.

Application Note 2004-03-17

PDF PDF 2.10 MB
Languages 
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

PDF PDF 1.17 MB
Languages 
Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope 
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.

Application Note 2009-06-01

PDF PDF 3.03 MB
Languages 
Planning Your Design for Debug: FPGA Dynamic Probe 

Application Note 2005-01-26

PDF PDF 785 KB
Languages