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High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
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- Application Note (102)
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1-25 of 102
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
Application Note 2012-02-02 |
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1.59 MB
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8 Hints for Debugging and Validating High-speed Buses
8 Hints for Debugging High-speed Buses
Application Note 2002-03-05 |
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2.24 MB
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8 Hints for Debugging Siemens MCU-based Designs
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from
Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the
same time. This MSO offers more...
Application Note 1998-11-01 |
PDF
736 KB
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A Simple, Powerful Method to Characterize Differential Interconnects
The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate.
Application Note 2011-06-17 |
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3.48 MB
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Advanced Jitter Generation and Analysis Product Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.
Application Note 2004-10-04 |
PDF
549 KB
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Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Application Note 2005-09-22 |
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812 KB
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Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Agilent's line of performance network analyzers (PNAs) focused on Software.
Application Note 2012-01-19 |
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Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities
The fundamentals of Jitter and it's capabilities with the N4900.
Application Note 2003-11-01 |
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3.99 MB
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Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.
Application Note 2006-08-29 |
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444 KB
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Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
Application Note 2007-01-31 |
PDF
272 KB
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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.
Application Note 2006-07-18 |
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5.33 MB
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Characterization of Balanced Digital Components and Communication Paths
Application Note 2001-11-19 |
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1.01 MB
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Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.
Application Note 2008-11-20 |
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Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.
Application Note 2000-08-01 |
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2.01 MB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
Application Note 2006-04-06 |
PDF
164 KB
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Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.
Application Note 2012-05-02 |
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6.46 MB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
Application Note 2013-01-24 |
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1.65 MB
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Debugging Parallel RapidIO Designs
Application Note 2003-01-09 |
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356 KB
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Debugging Signal Integrity and Protocol Layers on DDR Designs
As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures.
Application Note 2008-12-19 |
PDF
984 KB
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Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3)
Debugging USB 2.0 Systems
Application Note 2006-10-05 |
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Designing and Validating High-Speed Memory Buses (AN 1382-2)
DDR SDRAM (double data rate synchronous dynamic random access memory) is quickly becoming an accepted technology in the PC (personal computer) industry. Its low cost, high performance, and increasingly wide availability make it very desirable for PC memory buses and embedded designs such as high...
Application Note 2001-12-20 |
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1.51 MB
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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.
Application Note 2006-01-18 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
Application Note 2012-01-12 |
PDF
416 KB
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Ensuring Compliance and Interoperability of DDR Designs
The Joint Electronic Devices Engineering Council (JEDEC) specification requires a large number of test parameters to be verified for DDR compliance – a time-consuming exercise if you make the measurements manually.
Application Note 2008-12-19 |
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379 KB
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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.
Application Note 2000-11-01 |
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349 KB
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