高速數位解決方案
每一代數位標準的變化，都會帶來新的產品設計風險。藉由與業界專家以及像您這樣的工程師共同合作，我們得以取得第一手資訊並順利開發產品。 安捷倫高速數位測試解決方案建構於我們不斷與業界專家進行溝通交流的量測技術與專業知識之上。 藉由與您分享我們最先進的量測專業知識，安捷倫可協助您順利克服挑戰，並且加速推出傲視業界的產品。安捷倫是協助您實現最佳設計的推手。
瀏覽整個設計周期
請瀏覽產品網頁，以便觀看並尋找在設計週期的四個階段以及執行重要的信號完整度分析所需的解決方案。
1-25 / 174
|
Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
新聞簡訊 2013-06-11 |
|
|
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.
應用手冊 2013-06-06 |
PDF
606 KB
|
|
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.
應用手冊 2013-05-31 |
PDF
1.40 MB
|
|
Agilent Introduces Electrical Retimer Solution to Solve Challenges in Designing Chip-to-Chip Links
Agilent introduces the latest addition to its repeater model library for quickly and accurately solving the challenge posed by signal distortion in the multigigabit-per-second regime.
新聞資料 2013-05-29 |
|
|
Agilent EEsof EDA Customer Support Brochure
Whether you are a novice or an experienced user, Agilent EEsof EDA’s customer support offerings are designed to help you every step of the way.
型錄 2013-05-28 |
PDF
681 KB
|
|
Agilent Technologies Announces High-Speed Digital Seminar Tour with Micron
Agilent announces its 2013 High-Speed Digital Tour, covering more than 20 locations throughout Europe.
新聞資料 2013-05-28 |
|
|
Agilent EEsof EDA Software and Modular Solutions for Universities
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.
型錄 2013-05-27 |
PDF
2.05 MB
|
|
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
應用手冊 2013-05-10 |
PDF
2.02 MB
|
|
Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
基本展示 2013-05-08 |
|
|
ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
新聞資料 2013-05-07 |
|
|
Press Releases for N5990A
Press Releases for N5990A
新聞資料 2013-05-06 |
|
|
High Speed Digital Design and Simulation Videos on YouTube
Agilent EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.
基本展示 2013-04-19 |
|
|
EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
型錄 2013-04-09 |
PDF
128 KB
|
|
Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
新聞資料 2013-03-12 |
|
|
Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
新聞資料 2013-02-04 |
|
|
Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.
新聞資料 2013-01-29 |
|
|
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
應用手冊 2013-01-24 |
PDF
1.65 MB
|
|
Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
Agilent announces it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).
新聞資料 2013-01-15 |
|
|
DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
型錄 2012-12-19 |
PDF
1.14 MB
|
|
DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
型錄 2012-12-19 |
PDF
5.17 MB
|
|
Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.
新聞資料 2012-11-05 |
|
|
High Speed Digital Design with Advanced Design System
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
型錄 2012-11-02 |
PDF
1.65 MB
|
|
Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
應用手冊 2012-11-01 |
PDF
257 KB
|
|
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack
型錄 2012-10-30 |
PDF
1.31 MB
|
|
Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2012, Oct. 22-23, at the Tempe Mission Palms Hotel, in Tempe, Ariz.
新聞資料 2012-10-22 |
註冊myAgilent
註冊您的產品
為何選擇向安捷倫採購