High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
Navigate the entire design cycle
Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
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- Signal Integrity (2)
- Design and Simulation of High-Speed Digital (2)
- High-Speed Digital Analysis (3)
- Debugging High-Speed Digital Signals (1)
- Compliance for High-Speed Bus and Serial Interconnects (3)
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- Brochures & Competitive Overviews
- Brochure (7)
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- Brochures & Competitive Overviews
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- Additional Test & Measurement Products
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Agilent EEsof EDA Customer Support Brochure
Brochure 2005-02-01 |
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Agilent EEsof EDA Premier Communications Design Software
Agilent EEsof EDA premier communications design software product overview brochure.
Brochure 2011-08-03 |
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Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs
Brochure 2007-10-19 |
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HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2010-05-20 |
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Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.
Brochure 2008-06-25 |
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Mastering Jitter in Serial Gigabit Designs
Mastering Jitter in Serial Gigabit Designs
Promotional Materials 2006-06-22 |
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.
Brochure 2012-01-17 |
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2009-12-08 |
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