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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Agilent E2960B Series for PCI Express 1.0 & 2.0  
Providing customers with the fastest time to insight with an integrated suite of analyzer and exerciser tools.

Brochure 2007-05-15

PDF PDF 326 KB
Complete solutions for characterization, debug, compliance test of HDMI designs 
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs

Brochure 2007-10-19

PDF PDF 1.12 MB
DDR Memory Design and Test Overview  
Brief overview of Agilent solutions for DDR design and test.

Brochure 2012-12-19

PDF PDF 1.14 MB
DDR Memory Design and Test – A Better Way 
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

Brochure 2012-12-19

PDF PDF 5.17 MB
HDMI and DisplayPort Design and Test - A Better Way Brochure 
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2010-05-20

PDF PDF 1.37 MB
Jitter Solutions for Telecom, Enterprise, and Digital Designs 
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

Brochure 2008-06-25

PDF PDF 3.49 MB
Mastering Jitter in Serial Gigabit Designs 
Mastering Jitter in Serial Gigabit Designs

Promotional Materials 2006-06-22

PDF PDF 1.01 MB
PCI Express Design and Test - From Electrical to Protocol 
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
PCI Express Tools 

Brochure 2006-10-02

PDF PDF 1000 KB
Serial ATA Design and Test - A better way 
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2009-12-08

PDF PDF 1.43 MB