High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
Navigate the entire design cycle
Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
Refine the List
By Application
By Type of Content
- Document Library
-
Articles & Case Studies
- Case Study
-
Articles & Case Studies
By Product Category
1-2 of 2
|
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Agilent’s Advance Design System (ADS).
Case Study 2009-03-12 |
|
|
Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.
Case Study 2009-04-20 |
|
