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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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100G TX Designs - Tips & Techniques for Accurate Characterization Webcast 
Original broadcast on February 27, 2013

Webcast - recorded

 
Accelerating DDR4 Debug and Protocol Validation Webcast 
Original webcast February 26, 2013

Webcast - recorded

 
Accelerating USB 3.0 Protocol Development 
Original broadcast June 27, 2012

Webcast - recorded

 
Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - recorded

 
Application-focused Oscilloscope Measurements – Education Webcast Series 
Live broadcasts throughout 2013

Webcast

 
Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

Webcast - recorded

 
Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope 
Originally broadcast July 27, 2011

Webcast - recorded

 
Conquering USB 3.0 Physical Layer Test Challenges 
Original broadcast June 13, 2012

Webcast - recorded

 
Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices 
Original broadcast Oct 28, 2008. Webcast slides available for download only.

Webcast - recorded

 
Digital and Photonics Webcast Series 
Originally broadcast 2010, 2011. Access the recordings of many broadcasts

Webcast - recorded

 
Digital Webcast Series - Master the high-speed digital test challenge 
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list

Webcast - recorded

 
DisplayPort 1.2 Physical Layer Testing 
Original broadcast October 30, 2012

Webcast - recorded

 
Effective Crosstalk Characterization Webcast 
Original broadcast January 24, 2013

Webcast - recorded

 
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility  
August 5- 9, 2013; Denver, CO

Tradeshow

 
High-Sensitivity Current Measurements using an Oscilloscope Webcast 
Original broadcast April 17, 2013

Webcast - recorded

 
High-speed Oscilloscope Probing: Ensuring Maximum Performance and Signal Integrity 
Originally broadcast March 10, 2011

Webcast - recorded

 
How to Solve DDR Signal Integrity Validation Challenges 
How to Solve DDR Signal Integrity Validation Challenges

Training Materials 2008-02-13

 
Learn to Analyze, Validate and Debug High Speed DDR3 Memory 
Original broadcast Oct 4, 2011

Webcast - recorded

 
Making Your Most Accurate DDR4 Compliance Measurements Webcast 
Originally broadcast January 23, 2013

Webcast - recorded

 
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA  
Originally broadcast April 19, 2011

Webcast - recorded

 
Optimizing PXI Modular Functional Test System Throughput Webcast 
Originally broadcast April 27, 2011

Webcast - recorded

 
Oscilloscope Techniques for Precisely Measuring Small Signals Webcast 
Original broadcast February 13, 2013

Webcast - recorded

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
PCI Express 3.0 How to pass receiver compliance test for add-in cards and motherboards - webcast 
Original broadcast October 27, 2011

Webcast - recorded

 
PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation 
Originally broadcast Feb 10, 2011

Webcast - recorded

 

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