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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Accelerating USB 3.0 Protocol Development 
Original broadcast June 27, 2012

Webcast - recorded

 
Combining the Power of RF & Microwave with High Speed Digital Seminar Materials 
Access the papers from the 2012 Seminar

Seminar

 
Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices 
Original broadcast Oct 28, 2008. Webcast slides available for download only.

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Navigating Compliance Standards Panel Discussion 
Original broadcast July 17, 2013

Webcast - recorded

 
Overcoming MIPI Physical and Protocol Layer Test Challenges Seminar 
Santa Clara, CA - May 30, 2014

Seminar