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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Analyzing Digital Jitter and its Component eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 35 KB
Building a Precision Jitter Source 
Presentation, June 1, 2004 From the Japan Agilent Digital Measurement Forum, this presentation reviews the construction of a precision jitter source for analyzing digital jitter measurements.

Seminar Materials 2004-06-01

PDF PDF 623 KB
Characterization and Modeling of a High Speed Backplane Differential Channels eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 80 KB
Jitter Analysis: What Works, What Doesn't & Why eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 63 KB
Jitter in Digital Circuits eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 34 KB
Jitter Measurements for High-Speed Digital 
Jitter Measurements for High-Speed Digital Transmission

Seminar Materials 2006-06-14

PDF PDF 44 KB
Jitter Measurements with a High-Speed Scope eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 117 KB
Solving Real World Jitter Problems for High-Speed Communications eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 53 KB
Testing Receiver Jitter Tolerance eSeminar FAQs 
Testing Receiver Jitter Tolerance eSeminar FAQs

Seminar Materials 2006-06-14

PDF PDF 50 KB