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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Application-focused Oscilloscope Measurements – Education Webcast Series 
Live broadcasts throughout 2013

Webcast

 
Is Simulation a Requirement for Memory Designs Webcast 
Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern

Webcast

 
USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast 
Live broadcast June 13, 2013; 10am Pacific / 1pm Eastern

Webcast