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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility  
August 5- 9, 2013; Denver, CO

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IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
2011 show, last June, 2011; Baltimore Convention Center

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IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
June 17-22, 2012 in Montréal, Canada

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IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
June 2 - 7, 2013 in Seattle, WA

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