High-Speed Digital

In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Oscilloscopes, Analyzers, Meters (7)
- Oscilloscopes (5)
- Spectrum Analyzers (Signal Analyzers) (3)
- Network Analyzers (4)
- Handheld Oscilloscopes, Analyzers, Meters (2)
- Logic Analyzers (2)
- Protocol Analyzers and Exercisers (3)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (3)
- Bit Error Ratio Test (BERT) Solutions (4)
- Digital Multimeters (DMM) (2)
- Power Meters & Power Sensors (2)
- Frequency Counter Products (2)
- Noise Figure Analyzers & Noise Sources (2)
- LCR Meters & Impedance Measurement Products (2)
- Digitizers (2)
- DC Power Analyzers (2)
- Dynamic Signal Analyzers, Materials Measurement (2)
- Parameter & Device Analyzers, Curve Tracer (2)
Generators, Sources, Supplies (4)
- Signal Generators (Signal Sources) (2)
- Function / Arbitrary Waveform Generators (3)
- Pulse Generator Products (4)
- Data Generators & Analyzers (4)
- DC Power Supplies (2)
- Source Measure Units (2)
- DC Electronic Loads (2)
- AC Power Sources / Power Analyzers (2)
Software (22)
- Agilent EEsof EDA Software (21)
- Application Software for Instruments (4)
- Instrument Control Software (2)
- 89600 VSA Software (2)
- Agilent VEE (2)
- Interactive Functional Test (IFT) Software (2)
- Wireless Test Managers (2)
- EasyEXPERT software and Desktop EasyEXPERT software (2)
- Calibration & Adjustment Software (2)
- Agilent License Manager (2)
PXI, AXIe, DAQ & Modular Solutions (2)
- PXI Products & Solutions (2)
- AXIe Products & Solutions (2)
- Data Acquisition Modules - DAQ (2)
- PCI/PCIe/cPCI/VME Digitizers (2)
- USB Products & Solutions (2)
- VXI Products & Solutions (2)
Additional Test & Measurement Products (8)
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1-25 of 28

Agilent EEsof MMIC Design Symposium - Tuesday 8th November 2011 Agilent EEsof MMIC Design Symposium Seminar
Eventi di Agilent Italia Benvenuti nella pagina degli eventi di Agilent Italia Seminar
ADMF: Facing the challenges of Super speed USB 3.0 Product Development Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development Seminar Materials 2008-11-12	PDF 1.78 MB
Astonishing Enhancements to Signal Integrity EDA Tools Using Video Game 3D Glasses and GPUs Originally broadcast Jan 21, 2010 Webcast - recorded
Design and Test Challenges in Next Generation High-Speed Serial Standards Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference. Training Materials 2011-11-29
Digital and Photonics Webcast Series Originally broadcast 2010, 2011. Access the recordings of many broadcasts Webcast - recorded
Digital Webcast Series - Master the high-speed digital test challenge multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list Webcast - recorded
Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast Original broadcast March 20, 2013 Webcast - recorded
Genesys Webcasts - "How-To-Design" series Originally broadcast in 2009. Access the 6 WebEX recordings Webcast - recorded
High-Sensitivity Current Measurements using an Oscilloscope Webcast Original broadcast April 17, 2013 Webcast - recorded
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center Tradeshow
IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 17-22, 2012 in Montréal, Canada Tradeshow
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 2 - 7, 2013 in Seattle, WA Tradeshow
Innovations in EDA: Multi-Technology RF Design Using the New Advances in ADS 2011 Originally broadcast March 1, 2011 Webcast - recorded
Innovations in EM Simulation for High Speed Digital Design Originally broadcast Nov 18, 2010; Part of the Series: Signal Integrity for High Speed Digital Interconnects. Webcast - recorded
Introduction to EMI/EMC Challenges and Their Solution Agilent EEsof EDA presentation on how to, "Overcome High Speed Digital Design Challenges". Seminar Materials 2012-02-16	PDF 3.46 MB
Is Simulation a Requirement for Memory Designs Webcast Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern Webcast
Modeling Optical Fiber Communication with Channel Simulation Webcast Live broadcast March 6, 2013; 10am Pacific / 1pm Eastern Webcast - recorded
Overcome PI Challenges on Perforated Power/Groung Planes This presentation explains a different approach that's applicable to PI analysis on cost reduced consumer boards whose power/ground planes are perforated with signal traces. Seminar Materials 2012-01-19	PDF 2.30 MB
Overcome Signal Integrity Challenges in the multigigabit(s) Era When digital signals reach gigabit/s speeds, the unpredictable becomes the norm. The process of getting your project back on track starts with the best tools for the job. Seminar Materials 2011-12-15	PDF 781 KB
Overcoming Return-Path-Discontinuity in DDR3 and GDDR5 Memory-Controller Packages A day in the life of a Memory Architect. Seminar Materials 2011-10-24	PDF 1.86 MB
Signal Integrity Design Using Channel Simulation and EM Co-design The materials in this self-guided workshop will show you the “what if” design space exploration workflow that our new statistical eye diagram channel simulator enables Seminar Materials 2010-04-21
Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects. Webcast - recorded
Successful High Speed Digital Design with ADS, EMPro, and SystemVue The materials in this self-guided workshop will show you the latest high speed digital capabilites in ADS 2011. Seminar Materials 2011-09-29
Test & Measurement events in Europe, Middle East & Africa Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences. Seminar

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