高速数字
在您的成功之路上，每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时，我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术（建立在我们不断与业界专家进行沟通交流的基础之上）的结合。通过分享我们最新的经验，安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。
浏览完整的设计周期
通过浏览本网站，您将能了解到分别适用于设计周期全部四个阶段以及信号完整性分析核心部分的解决方案。
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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
内部通讯 2013-05-14 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
应用说明 2013-05-10 |
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2.02 MB
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Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
基本演示 2013-05-08 |
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ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
新闻资料 2013-05-07 |
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Press Releases for N5990A
Press Releases for N5990A
新闻资料 2013-05-06 |
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High Speed Digital Design and Simulation Videos on YouTube
Agilent EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.
基本演示 2013-04-19 |
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
手册 2013-04-09 |
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128 KB
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
新闻资料 2013-03-12 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
新闻资料 2013-02-04 |
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Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.
新闻资料 2013-01-29 |
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
应用说明 2013-01-24 |
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1.65 MB
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Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
Agilent announces it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).
新闻资料 2013-01-15 |
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
手册 2012-12-19 |
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5.17 MB
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
手册 2012-12-19 |
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1.14 MB
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优酷-EESof EDA 设计与仿真软件
优酷-EESof EDA 设计与仿真软件
基本演示 2012-12-03 |
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Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.
新闻资料 2012-11-05 |
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High Speed Digital Design with Advanced Design System
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
手册 2012-11-02 |
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1.65 MB
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
应用说明 2012-11-01 |
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257 KB
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ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack
手册 2012-10-30 |
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1.31 MB
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Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2012, Oct. 22-23, at the Tempe Mission Palms Hotel, in Tempe, Ariz.
新闻资料 2012-10-22 |
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
应用说明 2012-09-21 |
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STATS ChipPAC Launches QFN Package Design Kit for Agilent Technologies’ Advanced Design System
STATS ChipPAC announces the launch of its Quad Flat No-Lead (QFN) package design kit for ADS.
新闻资料 2012-09-12 |
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The Power of S-Parameters for High Speed Digital Design Tutorial
Learn to use S-parameters for high-speed digital designs with this video tutorial.
促销资料 2012-09-07 |
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S 参数系列：InfiniiSim 波形转换工具套件――应用指南
说明并解决工程师在使用示波器测量高速链路性能时最常遇到的 5 个问题。
应用说明 2012-08-21 |
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Agilent to Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility
Agilent will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility in Pittsburg, Aug. 5-10, 2012.
新闻资料 2012-07-18 |
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