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在您的成功之路上,每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时,我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术(建立在我们不断与业界专家进行沟通交流的基础之上)的结合。通过分享我们最新的经验,安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。

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Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

内部通讯 2014-04-10

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

基本演示 2014-03-20

 
优酷-EESof EDA 设计与仿真软件 
优酷-EESof EDA 设计与仿真软件

基本演示 2014-03-20

 
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

手册 2014-02-20

PDF PDF 6.47 MB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

新闻资料 2014-02-20

 
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement 
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

文章 2014-02-18

PDF PDF 2.99 MB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

文章 2014-02-18

PDF PDF 3.82 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

文章 2014-02-18

PDF PDF 8.07 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies 
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

文章 2014-02-18

PDF PDF 3.28 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

文章 2014-02-18

PDF PDF 947 KB
Mechanism of Jitter Amplification in Clock Channels 
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

文章 2014-02-18

PDF PDF 671 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

文章 2014-02-18

PDF PDF 1.78 MB
Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014 
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Agilent Technologies, at Designcon 2014, .

基本演示 2014-02-04

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

新闻资料 2014-01-27

 
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

应用说明 2014-01-23

Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014 
Agilent announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs.

新闻资料 2014-01-22

 
Quick Start for Signal Integrity Design Using Advanced Design System (ADS) 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

技术总览 2014-01-20

PDF PDF 3.80 MB
EDA Support Services 
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

手册 2013-11-09

PDF PDF 128 KB
Introducing Physics-Based VCSEL Model to Solve Challenges in Designing Rack-to-Rack Opto Links 
Agilent introduces a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links.

新闻资料 2013-10-23

 
Agilent RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Agilent EEsof software design tools and Agilent instruments.

手册 2013-10-16

PDF PDF 640 KB
Agilent Technologies’ Advanced Design System Selected by Kamstrup to Develop Smart Metering System 
Agilent announces that Kamstrup A/S, a provider of metering solutions for electricity, heat, water and natural gas, has selected Agilent's Advanced Design System (ADS).

新闻资料 2013-10-07

 
Agilent EEsof EDA Premier Communications Design Software 
The Agilent EEsof EDA catalog provides an excellent overview of all of Agilent's Electronic Design Automation (EDA) tools.

产品目录 2013-10-07

PDF PDF 8.61 MB
Agilent EEsof EDA Product Overview 
Agilent EEsof EDA premier communications design software product overview brochure.

手册 2013-09-30

PDF PDF 1.68 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

应用说明 2013-09-16

PDF PDF 1.78 MB
Agilent EEsof EDA Software and Modular Solutions for Universities 
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

手册 2013-08-16

PDF PDF 3.80 MB

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