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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
新聞簡訊 2013-05-14 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
應用手冊 2013-05-10 |
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2.02 MB
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Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
基本展示 2013-05-08 |
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ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
新聞資料 2013-05-07 |
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Press Releases for N5990A
Press Releases for N5990A
新聞資料 2013-05-06 |
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High Speed Digital Design and Simulation Videos on YouTube
Agilent EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.
基本展示 2013-04-19 |
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
型錄 2013-04-09 |
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128 KB
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
新聞資料 2013-03-12 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
新聞資料 2013-02-04 |
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Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.
新聞資料 2013-01-29 |
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
應用手冊 2013-01-24 |
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1.65 MB
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Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon
Agilent announces it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).
新聞資料 2013-01-15 |
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DDR Memory Design and Test Overview
Brief overview of Agilent solutions for DDR design and test.
型錄 2012-12-19 |
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1.14 MB
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DDR Memory Design and Test – A Better Way
Agilent offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.
型錄 2012-12-19 |
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5.17 MB
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Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.
新聞資料 2012-11-05 |
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High Speed Digital Design with Advanced Design System
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.
型錄 2012-11-02 |
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1.65 MB
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
應用手冊 2012-11-01 |
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257 KB
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ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack
型錄 2012-10-30 |
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1.31 MB
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Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2012, Oct. 22-23, at the Tempe Mission Palms Hotel, in Tempe, Ariz.
新聞資料 2012-10-22 |
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
應用手冊 2012-09-21 |
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STATS ChipPAC Launches QFN Package Design Kit for Agilent Technologies’ Advanced Design System
STATS ChipPAC announces the launch of its Quad Flat No-Lead (QFN) package design kit for ADS.
新聞資料 2012-09-12 |
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The Power of S-Parameters for High Speed Digital Design Tutorial
Learn to use S-parameters for high-speed digital designs with this video tutorial.
促銷資料 2012-09-07 |
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S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.
應用手冊 2012-08-21 |
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Agilent to Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility
Agilent will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility in Pittsburg, Aug. 5-10, 2012.
新聞資料 2012-07-18 |
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W1714 SystemVue AMI Modeling Kit / W1713 SystemVue SerDes Model Library
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.
產品型錄 2012-05-21 |
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672 KB
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