Build Your Own Test System

Agilent - Build Your Own

Agilent system components help you easily integrate your system –whether you´re starting from scratch, or refreshing an existing system.

With system-ready instruments, open software, and PC-standard I/O (LXI/USB/VXI/PXI), you´re getting the best tools for your greatest designs.

Explore the resources here to see how you can get maximum leverage from Agilent´s test equipment and software.

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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance Application Note 2008-10-15	PDF 281 KB Languages English \| 2008-10-15 \| PDF 281 KB 中文（简体） \| 2008-10-15 \| PDF 281 KB 日本語 \| 2008-10-15 \| PDF 1020 KB
CDPD MDBS Cell Site Test Software Troubleshooting This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution. General situations Data collection does not work A parameter you changed does not... Application Note 1997-06-01	PDF 102 KB
Choosing Your Test System Software Architecture (AN 1465-4) Application Note 2004-12-21	PDF 409 KB Languages English \| 2004-12-21 \| PDF 409 KB 中文（简体） \| 2006-09-01 \| PDF 1.09 MB 日本語 \| 2004-07-14 \| PDF 791 KB 中文（繁體） \| 2004-05-07 \| PDF 528 KB 한국어 \| 2004-05-07 \| PDF 528 KB
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB. Application Note 2007-02-02	PDF 175 KB Languages English \| 2007-02-02 \| PDF 175 KB 中文（简体） \| 2007-02-02 \| PDF 175 KB 日本語 \| 2007-03-07 \| PDF 495 KB 中文（繁體） \| 2007-02-02 \| PDF 175 KB
Modifying a GPIB System to Include LAN/LXI (AN 1465-26) This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible. Application Note 2007-05-10	PDF 271 KB Languages English \| 2007-05-10 \| PDF 271 KB 日本語 \| 2007-06-19 \| PDF 419 KB 中文（繁體） \| 2007-05-10 \| PDF 160 KB 한국어 \| 2007-05-10 \| PDF 160 KB
Next-generation Test Systems: Advancing the Vision with LXI - Application Note This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems. Application Note 2006-05-03	PDF 190 KB Languages English \| 2006-05-03 \| PDF 190 KB 中文（简体） \| 2005-08-01 \| PDF 1.33 MB 日本語 \| 2005-06-10 \| PDF 781 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems. Application Note 2007-02-23	PDF 234 KB Languages English \| 2007-02-23 \| PDF 234 KB 中文（简体） \| 2007-07-04 \| PDF 625 KB 日本語 \| 2005-02-17 \| PDF 960 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10. Application Note 2004-10-19	PDF 204 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing Application Note 2004-12-09	PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument. Application Note 2004-12-21	PDF 374 KB
Tips and Tricks for Using USB, LAN and GPIB This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C. Application Note 2006-05-03	PDF 277 KB
Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment. Application Note 2009-03-04	PDF 711 KB Languages English \| 2009-03-04 \| PDF 711 KB 日本語 \| 2009-05-25 \| PDF 1.12 MB
Using IVI For Your Instrument Driver This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice Application Note 2008-11-14	PDF 344 KB Languages English \| 2008-11-14 \| PDF 344 KB 中文（简体） \| 2008-11-14 \| PDF 344 KB 日本語 \| 2009-01-08 \| PDF 883 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking Application Note 2004-09-14	PDF 182 KB Languages English \| 2004-09-14 \| PDF 182 KB 中文（简体） \| 2004-12-28 \| PDF 5.15 MB
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test. Application Note 2004-07-29	PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs. Application Note 2005-04-01
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems Application Note 2004-12-13	PDF 408 KB
Using Synthetic Instruments in Your Test System (AN 1465-24) This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs. Application Note 2006-08-28	PDF 290 KB Languages English \| 2006-08-28 \| PDF 290 KB 中文（简体） \| 2006-09-06 \| PDF 764 KB 日本語 \| 2006-09-14 \| PDF 461 KB 中文（繁體） \| 2006-08-28 \| PDF 290 KB
Using the VISA COM I/O API in .NET - Application Note The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology. Application Note 2007-03-16	PDF 345 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB. Application Note 2004-11-19	PDF 194 KB

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