建置您個人的測試系統
安捷倫系統元件讓您輕鬆整合您的系統，不論您是要重頭開始，還是要更新您現有的系統。本系統元件具備現成可用的儀器、開放式軟體，以及 PC 標準 I/O (LXI/USB/VXI/PXI)，讓您取得最佳工具，完成您卓越的設計。請按一下下面任何連結，檢視如何充分利用安捷倫資源和測試設備。
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AN1465-26 修改 GPIB 系統以納入 LAN/LXI
本應用手冊將帶您瀏覽在一般 GPIB 測試系統中更換一台儀器的整個程序，並介紹如何利用系統軟體內的簡單變更完成這項工作。
應用手冊 2007-05-10 |
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LXI：超越GPIB、PXI及VXI克服測試所面臨的最大挑戰
本應用手冊著注於 LXI 標準的主要屬性、系統開發的過程所遭遇的主要難題、LXI 解決重要挑戰的方式，以及由 LXI 裝置啟用測試功能的可行性。
應用手冊 2006-11-09 |
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在您的測試系統中使用綜合型儀器
本手冊陳述 SI 的簡史，比較機架與卡槽系統和 SI 架構系統，說明 SI 的初步應用，並舉例說明如何使用 SI 模擬傳統儀器。
Search Keywords
應用手冊 2006-08-28 |
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將系統軟體從 GPIB 轉移至 LAN/LXI
應用手冊 2007-02-02 |
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從GPIB轉換至 LXI 檢視相同性、相異性及最佳實務
《從GPIB轉換至LXI》是一系列應用手冊中的第三冊，可協助您安排從GPIB、PXI或VXI到LXI的轉換過程。手冊中會比較GPIB和LXI、概述混合係架構、逐步簡述系統設定的方法，並描述如何簡易地修改現有的系統軟體，以搭配LXI裝置一起運作。
應用手冊 2006-08-07 |
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改用 LXI 的最佳理由：可建立較佳系統的主要優勢
本應用手冊將協助您轉換至 LXI，手冊將說明為何 LXI 是您新一代測試系統的最佳選擇之十大關鍵屬性，不論您是選擇單獨使用 LXI 或是使用 LXI、GPIB、VXI 或 PXI 的混合組合。
應用手冊 2006-03-15 |
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測試系統開發指南：選擇您的測試系統軟體結構
應用手冊 2004-05-07 |
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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems
應用手冊 2012-04-30 |
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Agilent LXI Class-B E5818A Trigger Box - Understanding Its Capability and Use Cases
Learn more about the LXI Class B E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.
應用手冊 2008-07-25 |
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424 KB
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Application Note1: Check for PCI and PCI-X protocol rule violation
The Agilent Protocol Observer, in combination with the Agilent Analyzer, simplifies the task of detecting protocol rule violations; this is not easy ...
應用手冊 2001-09-28 |
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412 KB
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Application Note3: Analyze how efficiently a device uses PCI/PCI-X resources
The Agilent PCI/PCI-X Performance Optimizer, a combination of testcard and software, provides help regarding performance analysis of extensive systems or signle devices.
If you perform benchmark tests, The Agilent PCI/PCI-X Performance Optimizer helps you quickly evaluate the performance of...
應用手冊 2001-10-04 |
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469 KB
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Application Note5: Monitor how your device acts on the PCI/PCI-X bus
Monitoring traffic on the PCI/PCI-X bus is done easily, but if you are designing PCI/PCI-x devices, you need to monitor the traffic relating to a particular device. This application allows you to debug your system quickly and effectively.
The Agilent PCI/PCI-X Analyzer, a combination of...
應用手冊 2001-10-04 |
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406 KB
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Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition
應用手冊 2008-03-19 |
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270 KB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
應用手冊 2008-10-15 |
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
應用手冊 2005-10-31 |
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CDPD MDBS Cell Site Test Software Troubleshooting
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution.
General situations
Data collection does not work
A parameter you changed does not...
應用手冊 1997-06-01 |
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102 KB
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
應用手冊 2004-12-21 |
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E6280A PNNI Signalling Test Software for the Broadband Series Test System
Designed for Agilent's industry-standard Broadband Series Test System, this product facilitates analysis and verification of both the PNNI routing protocol, used to distribute netwrk topology and routing information between ATM network switch responses within private ATM networks. Go to: http...
應用手冊 2000-02-01 |
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125 KB
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Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.
應用手冊 2009-05-05 |
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
應用手冊 2006-06-06 |
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Introduction to Test-System Design (AN 1465-1)
應用手冊 2005-01-20 |
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LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers
應用手冊 2007-10-30 |
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213 KB
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
應用手冊 2004-12-21 |
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Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.
應用手冊 2006-05-03 |
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Optimizing the Elements of an RF/Microwave Test System
Proving the device's ability to meet performance objectives depends on a test system that can give accurate, repeatable results. This application note highlights several ideas that can help you create such a system.
應用手冊 2005-08-12 |
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