天线测量
安捷伦的天线和雷达截面（RCS）测量产品帮助您始终保持竞争优势。安捷伦仪器提供最高的精度、可靠性和生产效率。
您可以将安捷伦仪器整合到您的天线测试系统中，来测量各种数据采集速度和测量灵敏度。应用包括：近场,远场,雷达截面测量
安捷伦与开发完整天线测试和覆盖范围解决方案的渠道合作伙伴合作。安捷伦仪器，例如 PNA、ENA、PSG 和附件，可以直接卖给最终用户或通过渠道合作伙伴卖给最终用户。
了解基础知识
- 选择能够满足您天线测量要求的所必需的硬件。 天线测试选型指南
- 探究用于天线和 RCS 测量的 PNA 系列配置和产品特性。 使用安捷伦 PNA 系列网络分析仪进行天线和 RCS 测量配置
- 了解天线术语、测量类型、误差源和测试条件。文章再版获得 Orbit/FR 公司许可。 天线测量基础知识
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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.
应用说明 2012-10-30 |
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1.11 MB
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使用网络和阻抗分析仪评测13.56 MHz RFID 标签和阅读器/记录器
本应用指南面向从事 RFID 天线设计和测试的工程师，探讨了如何使用网络分析仪和阻抗分析仪测试 RFID 天线特征，例如阻抗和谐振频率。
应用说明 2012-06-08 |
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Spherical Near-Field Antenna Measurements – NSI
Spherical Near-Field Antenna Measurement Solution from NSI and Agilent.
Solution Brief 2012-05-11 |
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Agilent's EMPro and Momentum Selected by OSAT for Next-Generation Circuit and Antenna Development
OSAT Company, which specializes in engineering analysis, testing and inspection techniques, is using Agilent’s Electromagnetic Professional software, EMPro, and the Momentum 3-D planar electromagnetic simulator to design and simulate innovative new antennas and circuits.
新闻资料 2012-02-24 |
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Low Cost Antenna Test – Eretec Inc.
Low Cost Antenna Test Solution from Eretec and Agilent
Solution Brief 2012-02-22 |
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Antenna Measurement using Multi-Probe Scanning - MVG
Antenna Measurement Solution using Multi-Probe Scanning from Microwave Vision Group and Agilent
Solution Brief 2012-02-21 |
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利用安捷伦提供的丰富资源，了解现代雷达/电子测量技术
订购海报和下载应用指南
促销资料 2012-02-16 |
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Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent
Solution Brief 2012-01-13 |
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安捷伦航天/国防雷达测试解决方案
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.
手册 2011-06-24 |
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1.84 MB
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Aerospace/Defense Radar Test Solutions from Agilent
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.
手册 2011-06-24 |
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1.84 MB
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Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.
应用说明 2010-12-20 |
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3.15 MB
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Making Conducted and Radiated Emissions Measurements
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.
应用说明 2010-07-13 |
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1.90 MB
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Solutions for Antenna Characterization
Learn how to fully evaluate the performance of your antennas in significantly less time with Agilent's solutions for antenna characterization.
手册 2010-06-30 |
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1.17 MB
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Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.
应用说明 2009-02-20 |
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199 KB
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使用20GHz E5071C ENA 网络分析仪进行UWB天线测量应用指南
应用说明 2008-12-01 |
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天线测试选型指南
选型指南 2008-10-22 |
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N5264A PNA-X 测量接收机传单
照片卡
促销资料 2008-10-17 |
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308 KB
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PNA - Antenna/RCS - Reduce Measurement Test Times
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.
应用说明 2004-12-20 |
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A New Gated-CW Radar Implementation
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.
应用说明 2004-03-03 |
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154 KB
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Cheetah PNA RCS and Antenna Measurement System
Introducing a radar measurement system based on Agilent's PNA network analyzer. Reprinted with permission of SPC Corp.
应用说明 2004-03-03 |
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582 KB
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用于天线测量的PNA系列网络分析仪触发功能白皮书
应用说明 2004-02-05 |
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PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the
measurement and characterization of antennas that are to be tested in a pulsed mode of operation.
应用说明 2004-01-06 |
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