ATE Applications

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Agilent Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.

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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems Application Note 2012-04-30	PDF 374 KB Languages English \| 2012-04-30 \| PDF 374 KB 中文（简体） \| 2005-10-05 \| PDF 1.43 MB 日本語 \| 2012-05-14 \| PDF 473 KB
66000 Modular Power System Product Note This 50-page product note provides information on how you can get the most from the advanced programmable features of the Agilent 66000 MPS to address a variety of applications. Application Note 2003-04-28	PDF 280 KB
Achieving Robust Interchangeability of Test Assets in ATE Systems What are the Measurement and Stimulus Subsystems and what has it got do with IVI? Application Note 2001-10-09
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance Application Note 2008-10-15	PDF 281 KB Languages English \| 2008-10-15 \| PDF 281 KB 中文（简体） \| 2008-10-15 \| PDF 281 KB 日本語 \| 2008-10-15 \| PDF 1020 KB
Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19) Application Note 2005-10-31	PDF 126 KB Languages English \| 2005-10-31 \| PDF 126 KB 日本語 \| 2006-01-18 \| PDF 503 KB
Choosing Your Test System Software Architecture (AN 1465-4) Application Note 2004-12-21	PDF 409 KB Languages English \| 2004-12-21 \| PDF 409 KB 中文（简体） \| 2006-09-01 \| PDF 1.09 MB 日本語 \| 2004-07-14 \| PDF 791 KB 中文（繁體） \| 2004-05-07 \| PDF 528 KB 한국어 \| 2004-05-07 \| PDF 528 KB
Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5) Application Note 2004-12-21	PDF 230 KB Languages English \| 2004-12-21 \| PDF 230 KB 中文（简体） \| 2006-09-01 \| PDF 937 KB 日本語 \| 2004-01-19 \| PDF 686 KB
Converting ATE Control from Agilent 83480A to 86100A (PN 86100-1) This application note gives you information about the 86100A syntax changes and new or enhanced commands. It also tells you the 83480A commands which are not supported by the 86100A. Application Note 2000-02-01	PDF 478 KB
Generating and Applying High-Power Output Signals This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals. Application Note 2009-09-30	PDF 333 KB Languages English \| 2009-09-30 \| PDF 333 KB 日本語 \| 2009-10-22 \| PDF 1.12 MB
How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) Application Note 2006-06-06	PDF 275 KB Languages English \| 2006-06-06 \| PDF 275 KB 日本語 \| 2006-06-17 \| PDF 518 KB
Improving Throughput with Fast RF Signal Generator Switching This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput. Application Note 2007-09-19	PDF 646 KB Languages English \| 2007-09-19 \| PDF 646 KB 日本語 \| 2006-12-01 \| PDF 1.04 MB
Introduction to Test-System Design (AN 1465-1) Application Note 2005-01-20	PDF 412 KB Languages English \| 2005-01-20 \| PDF 412 KB 中文（简体） \| 2006-08-01 \| PDF 1.41 MB 日本語 \| 2003-10-14 \| PDF 1.04 MB
LXI-compliant oscilloscope boosts efficiency in ATE systems The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven, widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of test systems. Application Note 2007-04-02	PDF 286 KB
Maximizing System Throughput and Optimizing System Deployment (AN 1465-7) Application Note 2004-12-21	PDF 144 KB Languages English \| 2004-12-21 \| PDF 144 KB 中文（简体） \| 2006-10-01 \| PDF 754 KB 日本語 \| 2004-04-20 \| PDF 503 KB
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB. Application Note 2007-02-02	PDF 175 KB Languages English \| 2007-02-02 \| PDF 175 KB 中文（简体） \| 2007-02-02 \| PDF 175 KB 日本語 \| 2007-03-07 \| PDF 495 KB 中文（繁體） \| 2007-02-02 \| PDF 175 KB
Modifying a GPIB System to Include LAN/LXI (AN 1465-26) This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible. Application Note 2007-05-10	PDF 271 KB Languages English \| 2007-05-10 \| PDF 271 KB 日本語 \| 2007-06-19 \| PDF 419 KB 中文（繁體） \| 2007-05-10 \| PDF 160 KB 한국어 \| 2007-05-10 \| PDF 160 KB
Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements. Application Note 2008-03-10	PDF 894 KB Languages English \| 2008-03-10 \| PDF 894 KB 中文（简体） \| 2008-10-01 \| PDF 4 MB
Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16) Application Note 2006-05-01	PDF 263 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10. Application Note 2004-10-19	PDF 204 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing Application Note 2004-12-09	PDF 189 KB
Test-System Development Guide: Operational Maintenance (AN 1465-8) Application Note 2004-12-21	PDF 217 KB Languages English \| 2004-12-21 \| PDF 217 KB 中文（简体） \| 2006-09-01 \| PDF 829 KB 日本語 \| 2004-07-20 \| PDF 893 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument. Application Note 2004-12-21	PDF 374 KB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) Application Note 2004-12-21	PDF 235 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking Application Note 2004-09-14	PDF 182 KB Languages English \| 2004-09-14 \| PDF 182 KB 中文（简体） \| 2004-12-28 \| PDF 5.15 MB
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test. Application Note 2004-07-29	PDF 270 KB

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