ATE Applications
Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Agilent Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.
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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems
Nota de aplicación 2012-04-30 |
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66000 Modular Power System Product Note
This 50-page product note provides information on how you can get the most from the advanced programmable features of the Agilent 66000 MPS to address a variety of applications.
Nota de aplicación 2003-04-28 |
PDF
280 KB
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Achieving Robust Interchangeability of Test Assets in ATE Systems
What are the Measurement and Stimulus Subsystems and what has it got do with IVI?
Nota de aplicación 2001-10-09 |
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Nota de aplicación 2008-10-15 |
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
Nota de aplicación 2005-10-31 |
PDF
126 KB
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Choosing Your Test System Software Architecture (AN 1465-4)
Nota de aplicación 2004-12-21 |
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Nota de aplicación 2004-12-21 |
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Converting ATE Control from Agilent 83480A to 86100A (PN 86100-1)
This application note gives you information about the 86100A syntax changes and new or enhanced commands. It also tells you the 83480A commands which are not supported by the 86100A.
Nota de aplicación 2000-02-01 |
PDF
478 KB
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Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.
Nota de aplicación 2009-09-30 |
PDF
333 KB
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
Nota de aplicación 2006-06-06 |
PDF
275 KB
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.
Nota de aplicación 2007-09-19 |
PDF
646 KB
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Introduction to Test-System Design (AN 1465-1)
Nota de aplicación 2005-01-20 |
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LXI-compliant oscilloscope boosts efficiency in ATE systems
The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven,
widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of
test systems.
Nota de aplicación 2007-04-02 |
PDF
286 KB
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
Nota de aplicación 2004-12-21 |
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
Nota de aplicación 2007-02-02 |
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Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.
Nota de aplicación 2007-05-10 |
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Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.
Nota de aplicación 2008-03-10 |
PDF
894 KB
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Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16)
Nota de aplicación 2006-05-01 |
PDF
263 KB
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
Nota de aplicación 2004-10-19 |
PDF
204 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Nota de aplicación 2004-12-09 |
PDF
189 KB
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Test-System Development Guide: Operational Maintenance (AN 1465-8)
Nota de aplicación 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Nota de aplicación 2004-12-21 |
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374 KB
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
Nota de aplicación 2004-12-21 |
PDF
235 KB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
Nota de aplicación 2004-09-14 |
PDF
182 KB
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
Nota de aplicación 2004-07-29 |
PDF
270 KB
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