ATE Applications
Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Agilent Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.
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- Webcast - recorded (4)
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Function / Arbitrary Waveform Generators
- 33522A Function / Arbitrary Waveform Generator, 30 MHz [Discontinued] (1)
- N8241A Arbitrary Waveform Generator Synthetic Instrument Module, 15-Bit, 1.25 GS/s or 625 MS/s (1)
- M9331A Arbitrary Waveform Generator, 10 bit, 1.25GS/s (1)
- M9330A Arbitrary Waveform Generator, 15 bit, 1.25GS/s (1)
- M8190A 12 GSa/s Arbitrary Waveform Generator (2)
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Function / Arbitrary Waveform Generators
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Generators, Sources, Supplies
1-5 of 5
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Developing Measurement and Analysis Systems with Agilent Instruments Webcast
Original broadcast December 4, 2012
Webcast - recorded |
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Measurement Challenges and Techniques for SATCOM
Original broadcast August 16, 2012
Webcast - recorded |
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Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011
Webcast - recorded |
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Ubiquitous Test with LXI Instrumentation
Original broadcast Nov 2, 2011
Webcast - recorded |
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Vector Modulation and Frequency Conversion Fundamentals Webcast
Live broadcast July 18, 2013; 10am PT / 1pm ET
Webcast |
