ATE Applications
Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Agilent Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.
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Aerospace/Defense RF Coaxial Cable Test - Beta LaserMike
Aerospace/Defense RF Coaxial Cable Test from Beta LaserMike and Agilent.
Solution Brief 2013-01-26 |
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RF Test Solutions – WinSoft
Military and Commercial RF Test Solutions from WinSoft and Agilent.
Solution Brief 2012-05-14 |
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Test Instrument Emulator - WinSoft
Test Instrument Emulation Solution from WinSoft and Agilent.
Solution Brief 2012-05-11 |
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COTS-Based Functional ATE – G Systems
Commercial-off-the-Shelf (COTS) based Automated Functional Test Solutions from G Systems and Agilent.
Solution Brief 2012-05-10 |
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Noise Figure Selection Guide
1958 1960 1970 1980 1990 2000 2008 Agilent Technologies Noise Figure Selection Guide Minimize the Noise 50 Years of Noise Figure Leadership
Selection Guide 2012-05-09 |
PDF
6.74 MB
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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems
Application Note 2012-04-30 |
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RF Module Test Solution for Speed, Accuracy and Performance – Auriga Microwave
RF Module Test Solution for Speed, Accuracy and Performance from Auriga Microwave and Agilent
Solution Brief 2012-03-01 |
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S-Parameter Measurements on Multiport Devices – In-Phase Technologies
S-Parameter Measurements on Multiport Devices from In-Phase Technologies and Agilent
Solution Brief 2012-02-24 |
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Phase Noise Measurement Selection Guide
This selection guide will discuss and compare Agilent's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.
Selection Guide 2011-09-02 |
PDF
1.57 MB
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Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.
Application Note 2009-09-30 |
PDF
333 KB
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Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.
Application Note 2009-09-03 |
PDF
1.11 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.
Application Note 2008-03-10 |
PDF
894 KB
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.
Application Note 2007-09-19 |
PDF
646 KB
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Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.
Application Note 2007-05-10 |
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Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.
Application Note 2007-05-08 |
PDF
303 KB
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LXI-compliant oscilloscope boosts efficiency in ATE systems
The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven,
widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of
test systems.
Application Note 2007-04-02 |
PDF
286 KB
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
Application Note 2007-02-02 |
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.
Application Note 2006-08-28 |
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
Application Note 2006-06-06 |
PDF
275 KB
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Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16)
Application Note 2006-05-01 |
PDF
263 KB
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Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20)
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.
Application Note 2006-01-17 |
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
Application Note 2005-10-31 |
PDF
126 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
Application Note 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
Application Note 2005-03-29 |
PDF
263 KB
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