To meet present and future mission requirements, the countless unique radios of the past are giving way to compatible, multi mode or software-defined digital systems that ensure easy interoperability. To keep pace, measurement solutions must be able to test these versatile radios throughout their lifecycles. From dynamic probing inside an FPGA to testing RF, IF and IQ, from design simulation to operational troubleshooting, we can help you ensure system readiness.
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In-circuit Test Systems - 3070 ICT
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Boundary Scan for Testing On-Board DDRs Webcast
Original broadcast October 22, 2013
Webcast - recorded
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